Electric near-field enhancing properties of a finite-size metal conical nano-tip

Ultramicroscopy

Volumn 107, Issue 2-3, 2007, Pages 151-157

  Goncharenko, A V ^a,b   Chang, Hung Chih ^a   Wang, Juen Kai ^a,c  

^a INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Finite difference time domain (FDTD) method; Nano tip; Scanning near field optical microscopy (SNOM)

Indexed keywords

APPROXIMATION THEORY; COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; ELECTRIC FIELDS; FINITE DIFFERENCE METHOD; TIME DOMAIN ANALYSIS;

ELECTRIC FIELD ENHANCEMENT FACTOR; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM); TIP GEOMETRY;

NANOSTRUCTURED MATERIALS;

METAL; SILVER;

ARTICLE; DIELECTRIC CONSTANT; ELECTRIC FIELD; MATHEMATICAL COMPUTING; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIMULATION; TECHNIQUE;

EID: 33845647618     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.06.004     Document Type: Article

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