In-Situ Electron Microscopy: Applications in Physics, Chemistry and Meterials Science

In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

Volumn , Issue , 2012, Pages

  Dehm, Gerhard ^a,b   Howe, James M ^c   Zweck, Josef ^d  

^a ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^b UNIVERSITY OF LEOBEN   (Austria)

^c University of Virginia   (United States)

^d UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891564568     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527652167     Document Type: Book

References (0)