An easy-to-use non-optical shear-force distance control for near-field optical microscopes

Review of Scientific Instruments

Volumn 67, Issue 5, 1996, Pages 1912-1916

  Barenz, J ^a,b   Hollricher, O ^a   Marti, O ^a  

^a UNIVERSITY OF ULM   (Germany)

^b Omicron Vakuumphysik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ATOMIC FORCE MICROSCOPY; DAMPING; GLASS FIBERS; LASER BEAMS; NATURAL FREQUENCIES; PIEZOELECTRIC DEVICES; POLYBUTENES; POSITION CONTROL; RESONANCE;

DISTANCE CONTROL; LOCK IN AMPLIFIERS; NONOPTICAL SHEAR FORCE DETECTION SYSTEM; PIEZOTUBES; SCANNING NEAR FIELD OPTICAL MICROSCOPES; TIP SAMPLE DISTANCE;

MICROSCOPES;

EID: 0030148898     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1146995     Document Type: Article

References (13)

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8. Piezo-tube obtained by Stavley Ltd. Outer diameter: 2 mm; Inner diameter: 1.5 mm; Length: 10 mm; Ceramic: EBL #2.
9. AIP 50th Anniversary Physics Vade Mecum, edited by H. L. Anderson (American Institute of Physics, New York, 1981), p. 41.
10. Polyisobutylene (PIB) obtained by BASF AG, Ludwigshafen, Germany. The designation is Opanol B3.
11. Test pattern provided by Topometrix GmbH, Darmstadt, Germany.
12. Omicron SPM and AFM control units. We use the normal force input in the AFM contact mode for shear-force distance control.
13. Fabricated by P. Pliska, ETH Zürich.