Offset-apertured near-field scanning optical microscope probes

Optics Express

Volumn 15, Issue 16, 2007, Pages 10163-10174

  Quong, M C ^a   Elezzabi, A Y ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; FINITE DIFFERENCE METHOD; FULL WIDTH AT HALF MAXIMUM; SURFACE PLASMON RESONANCE; TIME DOMAIN ANALYSIS;

APEX DIAMETERS; OFFSET APERTURED PROBE; SUBWAVELENGTH APERTURE; THROUGHPUT LIGHT INTENSITIES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 34547810949     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.010163     Document Type: Article

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