Gold nanocone near-field scanning optical microscopy probes

ACS Nano

Volumn 5, Issue 4, 2011, Pages 2570-2579

  Fleischer, Monika ^a   Weber Bargioni, Alexander ^b   Altoe, M Virginia P ^b   Schwartzberg, Adam M ^b   Schuck, P James ^b   Cabrini, Stefano ^b   Kern, Dieter P ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

electron beam induced deposition; gold nanocones; ion milling; nanostructures; near field enhancement; near field scanning optical microscopy; tip enhanced Raman spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY CANTILEVERS; ELECTRON BEAM-INDUCED DEPOSITION; ETCH MASK; FILM METALLIZATION; GOLD CONE; HIGH RESOLUTION; ION MILLING; NANOCONE; NEAR-FIELD; NEAR-FIELD ENHANCEMENT; OPTICAL ANTENNAS; OPTICAL IMAGING; OPTICAL NEAR FIELD; PLASMON RESONANCE FREQUENCIES; RAMAN SIGNATURES; RESONANCE FREQUENCIES; SCANNING PROBES; SHARP TIP; SUB-DIFFRACTION; TIP RADIUS; TIP-ENHANCED RAMAN SPECTROSCOPY; TOPOGRAPHICAL IMAGES; TOPOGRAPHICAL IMAGING;

ANTENNAS; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ELECTRON BEAMS; ELECTRON OPTICS; GOLD; GOLD COATINGS; GOLD DEPOSITS; IONS; MILLING (MACHINING); NANOCANTILEVERS; NANOSTRUCTURES; NATURAL FREQUENCIES; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; PROBES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 79955443435     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn102199u     Document Type: Article

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