Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip

Applied Physics Letters

Volumn 92, Issue 13, 2008, Pages

  Hoshino, Kazunori ^a   Rozanski, Lynn J ^b   Vanden Bout, David A ^b   Zhang, Xiaojing ^a  

^a The University of Texas at Austin   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC EXCITATION; LIGHT EMISSION; LIGHT EMITTING DIODES; OPTICAL RESOLVING POWER; PHOSPHORUS; SILICA; TOPOGRAPHY;

NEAR-FIELD IMAGING; NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM); TEST PATTERN; TIP-EMBEDDED LIGHT SOURCES;

OPTICAL MICROSCOPY;

EID: 41649106667     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2904698     Document Type: Article

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