Near-field localization in plasmonic superfocusing: A nanoemitter on a tip

Nano Letters

Volumn 10, Issue 2, 2010, Pages 592-596

  Neacsu, Catalin C ^a   Berweger, Samuel ^a   Olmon, Robert L ^a,b   Saraf, Laxmikant V ^c   Ropers, Claus ^d   Raschke, Markus B ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

^b University of Washington   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Local field enhacement; Nano focusing; Near field microscopy; Surface plasmon polariton

Indexed keywords

ADIABATIC PROPAGATION; AXIAL POLARIZATION; CONE ANGLE; FAR-FIELD; LOCALIZED EXCITATIONS; MODE FILTERS; NANO EMITTERS; NANO-FOCUS; NANO-FOCUSING; NEAR FIELD EFFECT; NEAR FIELD MICROSCOPY; NEAR-FIELD; NEW STRATEGY; POLARITONS; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM); SUB-WAVELENGTH; SUPERFOCUSING; SURFACE PLASMON POLARITONS; TM MODES;

FIELD EMISSION; LIGHT; LIGHT SOURCES; METAMATERIALS; PARTICLE OPTICS; PHONONS; PHOTONS; PLASMONS; QUANTUM THEORY; SOLIDS; SURFACE PLASMON RESONANCE; WAVE PROPAGATION;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

NANOMATERIAL; NANOPARTICLE; QUANTUM DOT;

ARTICLE; CHEMISTRY; EQUIPMENT DESIGN; INSTRUMENTATION; LASER; LIGHT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; OPTICS; PARTICLE SIZE; SEMICONDUCTOR; SURFACE PLASMON RESONANCE;

EQUIPMENT DESIGN; LASERS; LIGHT; MATERIALS TESTING; NANOPARTICLES; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICS AND PHOTONICS; PARTICLE SIZE; QUANTUM DOTS; SEMICONDUCTORS; SURFACE PLASMON RESONANCE;

EID: 76749133257     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl903574a     Document Type: Article

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