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Volumn 76, Issue 3, 2013, Pages

Femtosecond-laser ablation dynamics of dielectrics: Basics and applications for thin films

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EID: 84874440741     PISSN: 00344885     EISSN: None     Source Type: Journal    
DOI: 10.1088/0034-4885/76/3/036502     Document Type: Article
Times cited : (395)

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