Modification thresholds in femtosecond laser processing of pure silica: Review of dependencies on laser parameters [Invited]

Optical Materials Express

Volumn 1, Issue 4, 2011, Pages 766-782

  Poumellec, B ^a   Lancry, M ^a   Chahid Erraji, A ^a   Kazansky, P G ^b  

^a UNIVERSITÉ PARIS SUD   (France)

^b UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FEMTOSECOND LASER PROCESSING; LASER PARAMETERS; MACROSCOPIC EFFECTS; PURE SILICA;

SILICA; ULTRASHORT PULSES;

LASER BEAM EFFECTS;

EID: 80053272253     PISSN: None     EISSN: 21593930     Source Type: Journal    
DOI: 10.1364/OME.1.000766     Document Type: Article

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