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Volumn 96, Issue 7, 2010, Pages

Toward determinism in surface damaging of dielectrics using few-cycle laser pulses

Author keywords

[No Author keywords available]

Indexed keywords

FEW-CYCLE LASER PULSE; FREE CARRIERS; LASER INDUCED; QUANTITATIVE MEASUREMENT; TUNNELING IONIZATION;

DIELECTRIC MATERIALS; ELECTRON MOBILITY; FUSED SILICA; LASER PULSES; SILICA;

PULSED LASER APPLICATIONS;

EID: 77249166677 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3309700 Document Type: Article

Times cited : (58)

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