Modeling the effect of native and laser-induced states on the dielectric breakdown of wide band gap optical materials by multiple subpicosecond laser pulses

Journal of Applied Physics

Volumn 108, Issue 4, 2010, Pages

  Emmert, Luke A ^a   Mero, Mark ^a   Rudolph, Wolfgang ^a  

^a UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE IONIZATION; BREAKDOWN THRESHOLD; DAMAGE THRESHOLD; DIELECTRIC BREAKDOWNS; ELECTRON DENSITIES; GAP STATE; IONIZATION CROSS SECTION; LASER INDUCED; LASER-INDUCED DEFECT; LONG PULSE DURATIONS; MULTIPHOTON IONIZATION; PHOTON ENERGY; PULSE LASER; PULSE TRAIN; RATE EQUATIONS; SATURATION BEHAVIOR; SINGLE-PULSE; SUBPICOSECOND; TRAP DENSITY; WIDE BAND GAP;

CARRIER CONCENTRATION; DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRON DENSITY MEASUREMENT; ELECTRON MOBILITY; ELECTRONS; EQUATIONS OF STATE; HAFNIUM; HAFNIUM OXIDES; LASER DAMAGE; OXIDE FILMS; PARTICLE DETECTORS; PHOTOIONIZATION;

PULSED LASER APPLICATIONS;

EID: 77956316046     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3457791     Document Type: Conference Paper

References (24)

1. Laser-Induced Damage in Optical Materials: 40th Anniversary Collected Papers on DVD, 1969-2009, (SPIE, Bellingham, WA).
2. R. R. Gattass and E. Mazur, Nat. Photonics NPAHBY 1749-4885 2, 219 (2008). 10.1038/nphoton.2008.47
3. K. M. Davis, K. Miura, N. Sugimoto, and K. Hirao, Opt. Lett. OPLEDP 0146-9592 21, 1729 (1996). 10.1364/OL.21.001729
4. S. C. Jones, P. Braunlich, R. T. Casper, X. -A. Shen, and P. Kelly, Opt. Eng. OPEGAR 0091-3286 28, 1039 (1989).
5. A. Rosenfeld, M. Lorenz, R. Stoian, and D. Ashkenasi, Appl. Phys. A: Mater. Sci. Process. APAMFC 0947-8396 69, S373 (1999). 10.1007/s003390051419
6. M. Mero, B. Clapp, J. C. Jasapara, W. Rudolph, D. Ristau, K. Starke, J. Krüger, S. Martin, and W. Kautek, Opt. Eng. OPEGAR 0091-3286 44, 051107 (2005). 10.1117/1.1905343
7. D. Du, X. Liu, G. Korn, J. Squier, and G. Mourou, Appl. Phys. Lett. APPLAB 0003-6951 64, 3071 (1994). 10.1063/1.111350
8. B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B PRBMDO 0163-1829 53, 1749 (1996). 10.1103/PhysRevB.53. 1749
9. M. Lenzner, J. Krüger, S. Sartania, Z. Cheng, C. Spielmann, G. Mourou, W. Kautek, and F. Krausz, Phys. Rev. Lett. PRLTAO 0031-9007 80, 4076 (1998). 10.1103/PhysRevLett.80.4076
10. A. -C. Tien, S. Backus, H. Kapteyn, M. Murnane, and G. Mourou, Phys. Rev. Lett. PRLTAO 0031-9007 82, 3883 (1999). 10.1103/PhysRevLett.82.3883
11. M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B PRBMDO 0163-1829 71, 115109 (2005). 10.1103/PhysRevB.71.115109
12. N. Bloembergen, IEEE J. Quantum Electron. IEJQA7 0018-9197 10, 375 (1974). 10.1109/JQE.1974.1068132
13. A. M. Stoneham, J. Gavartin, A. L. Shluger, A. V. Kimmel, D. Muoz Ramo, H. M. Rønnow, G. Aeppli, and C. Renner, J. Phys.: Condens. Matter JCOMEL 0953-8984 19, 255208 (2007). 10.1088/0953-8984/19/25/255208
14. K. Tanimura, T. Tanaka, and N. Itoh, Phys. Rev. Lett. PRLTAO 0031-9007 51, 423 (1983). 10.1103/PhysRevLett.51.423
15. M. Konuma, Plasma Techniques for Film Deposition (Alpha Science, Harrow, UK, 2005).
16. D. N. Nguyen, L. A. Emmert, M. Mero, W. Rudolph, D. Patel, E. Krous, and C. S. Menoni, Proc. SPIE PSISDG 0277-786X 7132, 71320N (2008). 10.1117/12.804452
17. L. V. Keldysh, Sov. Phys. JETP SPHJAR 0038-5646 20, 1307 (1965).
18. M. Mero, J. Zeller, and W. Rudolph, in Femtosecond Laser Spectroscopy, edited by, P. Hannaford, (Springer, New York, 2005), p. 305. 10.1007/0-387-23294-X-11
19. N. B. Delone and V. P. Krainov, Multiphoton Processes in Atoms (Springer-Verlag, Berlin, 1994).
20. L. W. Hobbs, J. Am. Ceram. Soc. JACTAW 0002-7820 62, 267 (1979). 10.1111/j.1151-2916.1979.tb09480.x
21. R. T. Casper, S. C. Jones, P. Braunlich, and P. Kelly, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 46, 231 (1990). 10.1016/0168-583X(90) 90703-W
22. A. Shluger, M. Georgiev, and N. Itoh, Philos. Mag. B PMABDJ 1364-2812 63, 955 (1991). 10.1080/13642819108205550
23. S. Guizard, P. Martin, G. Petite, P. D'Oliveira, and P. Meynadier, J. Phys.: Condens. Matter JCOMEL 0953-8984 8, 1281 (1996). 10.1088/0953-8984/8/9/ 018
24. D. Patel, P. Langston, A. Markosyan, E. M. Krous, B. Langdon, F. Furch, B. Reagan, R. Route, M. M. Fejer, J. J. Rocca, and C. S. Menoni, Proc. SPIE PSISDG 0277-786X 7132, 71320L (2008). 10.1117/12.804434