Structural characterization of CdS thin film on quartz formed by femtosecond pulsed laser deposition at high temperature

Thin Solid Films

Volumn 516, Issue 8, 2008, Pages 2003-2008

  Tong, X L ^a   Jiang, D S ^a   Liu, Z M ^a   Luo, M Z ^a   Li, Y ^a   Lu, P X ^b   Yang, G ^b   Long, H ^b  

^a WUHAN UNIVERSITY   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Cadmium sulfide; Deposition temperature effect; Femtosecond laser deposition; Optical properties; X ray diffraction

Indexed keywords

HIGH TEMPERATURE EFFECTS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; ULTRASHORT PULSES; X RAY DIFFRACTION ANALYSIS;

CADMIUM SULFIDE; COMPOSITIONAL SEGREGATION; FEMTOSECOND LASER DEPOSITION;

THIN FILMS;

EID: 38649094598     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.06.067     Document Type: Article

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