Femtosecond optical breakdown in dielectrics

Physical Review Letters

Volumn 80, Issue 18, 1998, Pages 4076-4079

  Lenzner, M ^a   Kruger J ^b   Sartania, S ^a   Cheng, Z ^a   Spielmann, Ch ^a   Mourou, G ^c   Kautek, F ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRONS; LASER ABLATION; LASER PULSES; LIGHT; PHOTOIONIZATION; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS;

BAND GAP; FEMTOSECOND OPTICAL BREAKDOWN; KELDYSH THEORY; MULTIPHOTON IONIZATION;

NONLINEAR OPTICS;

EID: 0032482005     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.4076     Document Type: Article

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