Reduction of damage threshold in dielectric materials induced by negatively chirped laser pulses

Applied Physics Letters

Volumn 87, Issue 24, 2005, Pages 1-3

  Louzon, E ^a   Henis, Z ^a   Pecker, S ^a   Ehrlich, Y ^a   Fisher, D ^a   Fraenkel, M ^a   Zigler, A ^b  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRONS; ENERGY GAP; FUSED SILICA; IONIZATION; LASER PULSES;

BAND GAP; MULTIPHOTON IONIZATION;

LASER DAMAGE;

EID: 30344475526     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2140476     Document Type: Article

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