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Volumn 27, Issue 7, 2012, Pages 1050-1068

SIMS imaging of the nanoworld: Applications in science and technology

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL OBJECTS; CELLULAR BIOLOGY; CHEMICAL IMAGING; COSMOCHEMISTRY; HIGH RESOLUTION; LATERAL RESOLUTION; MATERIALS RESEARCH; MEDICAL RESEARCH; NANO SCALE; NANO-SCALE IMAGING; SCIENCE AND TECHNOLOGY; SIMS IMAGING; STATE OF THE ART; SURFACE CHEMICAL ANALYSIS;

EID: 84862523106     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c2ja30015j     Document Type: Review
Times cited : (66)

References (233)
  • 44
    • 84886551032 scopus 로고    scopus 로고
    • in, ed. G. Friedbacher and H. Bubert, Wiley-VCH, Weinheim
    • H. Hutter, in Surface and Thin Film Analysis, ed., G. Friedbacher, and, H. Bubert, Wiley-VCH, Weinheim, 2011, pp. 141-160
    • (2011) Surface and Thin Film Analysis , pp. 141-160
    • Hutter, H.1
  • 46
  • 48
    • 4444264671 scopus 로고    scopus 로고
    • in, ed. G. Friedbacher and H. Bubert, Wiley-VCH, Weinheim
    • H. F. Arlinghaus, in Surface and Thin Film Analysis, ed., G. Friedbacher, and, H. Bubert, Wiley-VCH, Weinheim, 2011, pp. 117-140
    • (2011) Surface and Thin Film Analysis , pp. 117-140
    • Arlinghaus, H.F.1
  • 55
    • 84862559590 scopus 로고    scopus 로고
    • at
    • Certificate of BAM-L200 at http://www.rm-certificates.bam.de/de/rm- certificates-media/rm-cert-layer-and-surface/bam-l200e.pdf
    • Certificate of BAM-L200
  • 170


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.