Spatially resolved chemical analysis with an NSOM-based laser desorption microprobe

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 111-115

  Kossakovski, D A ^a   O'Connor, S D ^a   Widmer, M ^a   Baldeschwieler, J D ^a   Beauchamp, J L ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION; DESORPTION; IMAGING TECHNIQUES; LASERS; SPECTROMETERS; SURFACES;

LASER DESORPTION MICROPROBE; NEAR FIELD SCANNING OPTICAL MICROSCOPE; SURFACE TOPOGRAPHY; TIME OF FLIGHT MASS SPECTROMETER;

OPTICAL MICROSCOPY;

ARTICLE; CHEMICAL ANALYSIS; DESORPTION; INSTRUMENT; LASER; MASS SPECTROMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SENSOR; SURFACE PROPERTY;

EID: 0032033787     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00054-5     Document Type: Article

References (9)

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