Imaging surface analysis: Lateral resolution and its relation to contrast and noise

Journal of Analytical Atomic Spectrometry

Volumn 25, Issue 9, 2010, Pages 1440-1452

  Senoner, Mathias ^a   Wirth, Thomas ^a   Unger, Wolfgang E S ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CERTIFIED REFERENCE MATERIALS; CONTRAST TRANSFER FUNCTION; ELEMENT MAPPING; EXPERIMENTAL PARAMETERS; GAUSSIANS; LATERAL RESOLUTION; LINE SCAN; LORENTZIAN LINE; NOISE RATIO; NORMALIZED VALUES; QUALITY PARAMETERS; REAL-TIME ESTIMATION; SIMULATED IMAGES; SQUARE-WAVE; TOF SIMS;

IMAGE RESOLUTION; MOBILE TELECOMMUNICATION SYSTEMS; SECONDARY ION MASS SPECTROMETRY; SIGNAL TO NOISE RATIO; SURFACE ANALYSIS;

SURFACES;

EID: 77955825527     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c004323k     Document Type: Conference Paper

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