The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning

Nanotechnology

Volumn 20, Issue 12, 2009, Pages

  Uyar, Tamer ^a,c   Havelund, Rasmus ^a   Hacaloglu, Jale ^b   Zhou, Xingfei ^a   Besenbacher, Flemming ^a   Kingshott, Peter ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

^c BILKENT UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BEAD-FREE FIBERS; BETA CYCLODEXTRINS; CD CONCENTRATIONS; CRYSTALLINE AGGREGATES; FIBER MATRIXES; FIBER SURFACES; FOURIER TRANSFORM INFRA-RED SPECTROSCOPIES; FUNCTIONALIZED; HOMOGENEOUS SOLUTIONS; INCLUSION COMPLEXATION; INCLUSION COMPLEXES; MATRIXES; MOLECULAR FILTERS; MOLECULAR LAYERS; NANOFILTERS; POLYMER CONCENTRATIONS; POLYSTYRENE NANOFIBERS; PYROLYSIS-MASS SPECTROSCOPIES; RELATIVE CONCENTRATIONS; STATIC SECONDARY ION MASS SPECTROMETRIES; TIME OF FLIGHTS; TOF-SIMS; TRANSMISSION ELECTRON MICROSCOPES; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES; XPS;

CONCENTRATION (PROCESS); CONDUCTING POLYMERS; DATA STORAGE EQUIPMENT; DIMETHYLFORMAMIDE; ELECTROSPINNING; FIBERS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MASS SPECTROMETERS; MICROSCOPES; MOLECULAR SPECTROSCOPY; MOLECULES; NANOFIBERS; NANOFILTRATION; POLYMER BLENDS; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SPECTRUM ANALYSIS; SURFACE ANALYSIS; THERMOGRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

POLLUTION;

BETA CYCLODEXTRIN; CYCLODEXTRIN; MOLECULAR LAYER; N,N DIMETHYLFORMAMIDE; NANOFIBER; POLYMER; POLYSTYRENE; BETA CYCLODEXTRIN DERIVATIVE; NANOMATERIAL; POLYSTYRENE DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CONCENTRATION (PARAMETERS); CONDUCTANCE; ELECTRIC CONDUCTIVITY; ELECTROSPINNING; FLIGHT; HUMAN; INFRARED SPECTROSCOPY; MASS SPECTROMETRY; MORPHOLOGY; NANOFILTER; PRIORITY JOURNAL; PYROLYSIS; SURFACE PROPERTY; THERMOGRAVIMETRY; TIME OF FLIGHT MASS SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; CHEMISTRY; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; ULTRASTRUCTURE; VISCOSITY;

BETA-CYCLODEXTRINS; MASS SPECTROMETRY; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOSTRUCTURES; POLYSTYRENES; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SPECTRUM ANALYSIS; THERMOGRAVIMETRY; VISCOSITY;

EID: 65549127220     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/12/125605     Document Type: Article

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