SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 519, Issue 18, 2011, Pages 6183-6189

Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry

(4) Mayerhofer, Karl E a Heier, Jakob a Maniglio, Ylenia a Keller, Beat Andreas a

a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY (Switzerland)

Author keywords

Cyanine dye; Film morphology; Organic films; Phase separation; Secondary ion mass spectroscopy; Thin films

Indexed keywords

CYANINE DYES; DEPOSITION SOLUTION; DEPTH RESOLUTION; DOMAIN STRUCTURE; DYE LAYERS; DYE MOLECULE; EXTENDED MODEL; FILM FORMATIONS; FILM MORPHOLOGY; INHOMOGENEITIES; METHYL ESTERS; MICROMETER DIMENSIONS; MORPHOLOGICAL FEATURES; ORGANIC FILMS; ORGANIC THIN FILMS; PARTIAL DEPLETION; PRIMARY STRUCTURES; SECONDARY ION MASS SPECTROSCOPY; SELF-STRUCTURING; SUBMICROMETERS; THIN LIQUIDS; THREE-DIMENSIONAL ANALYSIS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; UV-VIS SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; BUTYRIC ACID; DEPTH PROFILING; FATTY ACIDS; IONS; MICROMETERS; OPTOELECTRONIC DEVICES; PHASE SEPARATION; PHOTOELECTRON SPECTROSCOPY; SECONDARY EMISSION; SEMICONDUCTOR MATERIALS; SPECTROMETRY; THIN FILMS; THREE DIMENSIONAL; ULTRAVIOLET SPECTROSCOPY; VAPOR DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY;

SECONDARY ION MASS SPECTROMETRY;

EID: 79958158681 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.04.018 Document Type: Article

Times cited : (4)

References (20)

1
- 0001210137
- N.S. Sariciftci, and A.J. Heeger Int. J. Mod. Phys. B 8 1994 237
- (1994) Int. J. Mod. Phys. B , vol.8 , pp. 237
- Sariciftci, N.S.¹ Heeger, A.J.²

2
- 11944258963
- N.S. Sariciftci, L. Smilowitz, A.J. Heeger, and F. Wudl Science 258 1992 1474
- (1992) Science , vol.258 , pp. 1474
- Sariciftci, N.S.¹ Smilowitz, L.² Heeger, A.J.³ Wudl, F.⁴

3
- 0037127187
- F. Würthner, R. Wortmann, and K. Meerholz Chem. Phys. Chem. 3 2002 17
- (2002) Chem. Phys. Chem. , vol.3 , pp. 17
- Würthner, F.¹ Wortmann, R.² Meerholz, K.³

4
- 0031480080
- A. Oron, S.H. Davis, and S.G. Bankoff Rev. Mod. Phys. 69 1997 931
- (1997) Rev. Mod. Phys. , vol.69 , pp. 931
- Oron, A.¹ Davis, S.H.² Bankoff, S.G.³

5
- 15744367103
- P. Müller-Buschbaum, E. Bauer, O. Wumnicke, and M. Stamm J. Phys. Condens. Matter 17 2005 363
- (2005) J. Phys. Condens. Matter , vol.17 , pp. 363
- Müller-Buschbaum, P.¹ Bauer, E.² Wumnicke, O.³ Stamm, M.⁴

6
- 48149106682
- J. Heier, J. Groenewold, S. Huber, F. Nüesch, and R. Hany Langmuir 24 2008 7316
- (2008) Langmuir , vol.24 , pp. 7316
- Heier, J.¹ Groenewold, J.² Huber, S.³ Nüesch, F.⁴ Hany, R.⁵

7
- 38149088693
- H. Benmansour, F.A. Castro, M. Nagel, J. Heier, R. Hany, and F. Nüesch Chimia 61 2007 787
- (2007) Chimia , vol.61 , pp. 787
- Benmansour, H.¹ Castro, F.A.² Nagel, M.³ Heier, J.⁴ Hany, R.⁵ Nüesch, F.⁶

8
- 77957891924
- J. Heier, R. Steiger, F. Nüesch, and R. Hany Langmuir 26 2010 3955
- (2010) Langmuir , vol.26 , pp. 3955
- Heier, J.¹ Steiger, R.² Nüesch, F.³ Hany, R.⁴

9
- 34047109564
- I. Horcas, R. Fernández, J.M. Gómez-Rodríguez, J. Colchero, J. Gómez-Herrero, and A.M. Baro Rev. Sci. Instrum. 78 2007 13,705
- (2007) Rev. Sci. Instrum. , vol.78 , pp. 13
- Horcas, I.¹ Fernández, R.² Gómez-Rodríguez, J.M.³ Colchero, J.⁴ Gómez-Herrero, J.⁵ Baro, A.M.⁶

10
- 56449124172
- L. Houssiau, B. Douhard, and N. Mine Appl. Surf. Sci. 255 2008 970
- (2008) Appl. Surf. Sci. , vol.255 , pp. 970
- Houssiau, L.¹ Douhard, B.² Mine, N.³

11
- 56449115157
- H.-G. Cramer, T. Grehl, F. Kollmer, R. Moellers, E. Niehuis, and D. Rading Appl Surf Sci 255 2008 966
- (2008) Appl Surf Sci , vol.255 , pp. 966
- Cramer, H.-G.¹ Grehl, T.² Kollmer, F.³ Moellers, R.⁴ Niehuis, E.⁵ Rading, D.⁶

12
- 33747186486
- K. Norrman, N.B. Larsen, and F.C. Krebs Sol. Energy Mater. Sol. Cells 90 2006 2793
- (2006) Sol. Energy Mater. Sol. Cells , vol.90 , pp. 2793
- Norrman, K.¹ Larsen, N.B.² Krebs, F.C.³

13
- 27844472680
- K. Norrman, and F.C. Krebs Sol. Energy Mater. Sol. Cells 90 2006 213
- (2006) Sol. Energy Mater. Sol. Cells , vol.90 , pp. 213
- Norrman, K.¹ Krebs, F.C.²

14
- 31744446565
- K. Norrman, and F.C. Krebs Proc. SPIE 5938 2005 59380D
- (2005) Proc. SPIE , vol.5938
- Norrman, K.¹ Krebs, F.C.²

15
- 2942590926
- J.K.J. van Duren, X. Yang, J. Loos, C.W.T. Bulle-Lieuwma, A.B. Sieval, J.C. Hummelen, and R.A.J. Janssen Adv. Funct. Mater. 14 2004 425
- (2004) Adv. Funct. Mater. , vol.14 , pp. 425
- Van Duren, J.K.J.¹ Yang, X.² Loos, J.³ Bulle-Lieuwma, C.W.T.⁴ Sieval, A.B.⁵ Hummelen, J.C.⁶ Janssen, R.A.J.⁷

16
- 33747193276
- W.-Y. Chen, Y.-C. Ling, B.-J. Chen, H.-H. Shih, and C.-H. Cheng Appl. Surf. Sci. 252 2006 6594
- (2006) Appl. Surf. Sci. , vol.252 , pp. 6594
- Chen, W.-Y.¹ Ling, Y.-C.² Chen, B.-J.³ Shih, H.-H.⁴ Cheng, C.-H.⁵

17
- 77649107742
- B.-Y. Yu, W.-C. Lin, W.-B. Wang, S.-I. Iida, S.-Z. Chen, K.C.-Y. Liu, C.-H. Kuo, S.-H. Lee, W.-L. Kao, G.-J. Yen, Y.-W. You, C.-P. Liu, and J.-H. Jou ACS Nano 4 2010 833
- (2010) ACS Nano , vol.4 , pp. 833
- Yu, B.-Y.¹ Lin, W.-C.² Wang, W.-B.³ Iida, S.-I.⁴ Chen, S.-Z.⁵ Liu, K.C.-Y.⁶ Kuo, C.-H.⁷ Lee, S.-H.⁸ Kao, W.-L.⁹ Yen, G.-J.¹⁰ You, Y.-W.¹¹ Liu, C.-P.¹² Jou, J.-H.¹³

18
- 20944444946
- R.G. Wilson, G.E. Lux, and C.L. Kirschbaum J. Appl. Phys. 73 1993 2524
- (1993) J. Appl. Phys. , vol.73 , pp. 2524
- Wilson, R.G.¹ Lux, G.E.² Kirschbaum, C.L.³

19
- 73949093679
- S. Yamamoto, D. Kitazawa, J. Tsukamoto, T. Shibamori, h Seki, and Y. Nakagawa Thin Soid Films 51 2010 2115
- (2010) Thin Soid Films , vol.51 , pp. 2115
- Yamamoto, S.¹ Kitazawa, D.² Tsukamoto, J.³ Shibamori, T.⁴ Seki, H.⁵ Nakagawa, Y.⁶

20
- 42749098668
- A. Pototsky, M. Bestehorn, D. Merkt, and U. Thiele Phys. Rev. E 70 2004 25,201
- (2004) Phys. Rev. e , vol.70 , pp. 25
- Pototsky, A.¹ Bestehorn, M.² Merkt, D.³ Thiele, U.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.