X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

Beilstein Journal of Nanotechnology

Volumn 3, Issue 1, 2012, Pages 345-350

  Bittencourt, Carla ^a   Hitchock, Adam P ^b   Ke, Xiaoxing ^a   Van Tendeloo, Gustaaf ^a   Ewels, Chris P ^c   Guttmann, Peter ^d  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b MCMASTER UNIVERSITY   (Canada)

^c UNIVERSITÉ DE NANTES   (France)

^d HAHN MEITNER INSTITUT   (Germany)

Author keywords

Carbon; Graphene; Nanostructure; Nexafs; X ray microscopy

Indexed keywords

CARBON K-EDGE; DENSITY GRADIENTS; EXFOLIATED GRAPHITE; FULL-FIELD; GRAPHENE LAYERS; GRAPHITE FLAKES; IMAGE SEQUENCE; METAL IMPURITIES; NEXAFS; OUT-OF-PLANE; REFERENCE SPECTRUM; SODIUM CHOLATE; SPECTRAL FEATURE; TOPOLOGICAL DEFECT; ULTRACENTRIFUGATION; X RAY ABSORPTION FINE STRUCTURES; X RAY MICROSCOPY;

CARBON; CENTRIFUGATION; ELECTRONIC STRUCTURE; GRAPHENE; GRAPHITE; NANOSTRUCTURES; SODIUM; X RAY ABSORPTION SPECTROSCOPY;

X RAY MICROSCOPES;

EID: 84861391084     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.3.39     Document Type: Article

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