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Volumn 82, Issue 6, 2010, Pages 2426-2433

Spatial-resolution limits in mass spectrometry imaging of supported lipid bilayers and individual lipid vesicles

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; BIOLOGICAL SAMPLES; CHEMICALLY MODIFIED; GOLD SURFACES; HIGH-RESOLUTION IMAGING; IMAGING TOF-SIMS; LATERAL RESOLUTION; LIPID COMPOSITION; LIPID MEMBRANES; LIPID VESICLES; OPTIMIZED CONDITIONS; PHOSPHOCHOLINE; PRIMARY IONS; SECONDARY ION YIELD; SPATIAL RESOLUTION; SUB-100 NM; SUBMICROMETERS; SUPPORTED LIPID BILAYERS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

EID: 77949781463     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac902744u     Document Type: Article
Times cited : (43)

References (40)
  • 14
    • 0004123702 scopus 로고    scopus 로고
    • VickermanJ. C.Briggs D. Eds IM Publications and SurfaceSpectra Limited; Charlton, Chichester, West Sussex, UK
    • Vickerman, J. C.; Briggs, D. Eds., TOF-SIMS: Surface Analysis by Mass Spectrometry; IM Publications and SurfaceSpectra Limited; Charlton, Chichester, West Sussex, UK, 2001.
    • (2001) TOF-SIMS: Surface Analysis by Mass Spectrometry


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.