Multivariate image analysis strategies for ToF-SIMS images with topography

Surface and Interface Analysis

Volumn 41, Issue 8, 2009, Pages 653-665

  Lee, J L S ^a   Gilmore, I S ^a   Fletcher, I W ^b   Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b Intertek MSG   (United Kingdom)

Author keywords

Data scaling; Detector saturation; Multivariate analysis; Multivariate curve resolution; Principal component analysis; Static SIMS

Indexed keywords

CHEMICAL COMPONENT; CHEMICAL FEATURES; CHEMICAL VARIATIONS; DATA SCALING; DEAD-TIME CORRECTION; ION INTENSITIES; MANUAL ANALYSIS; MULTICOMPONENTS; MULTIVARIATE ANALYSIS; MULTIVARIATE ANALYSIS METHODS; MULTIVARIATE CURVE RESOLUTION; MULTIVARIATE IMAGE ANALYSIS; OPTIMAL RESOLUTION; ORGANIC SURFACES; ROBUST ANALYSIS; ROBUST APPLICATION; SCALING METHOD; SPECTRAL DOMAINS; STATIC SIMS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

BIOLOGICAL MATERIALS; CHEMICAL ANALYSIS; DECISION MAKING; DETECTORS; IMAGE ANALYSIS; IONS; MASS SPECTROMETERS; MULTIVARIANT ANALYSIS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY;

PRINCIPAL COMPONENT ANALYSIS;

EID: 68349138287     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3070     Document Type: Article

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