Atom probe tomography and nano secondary ion mass spectroscopy investigation of the segregation of boron at austenite grain boundaries in 0.5 wt.% carbon steels

Metals and Materials International

Volumn 17, Issue 3, 2011, Pages 413-416

  Seol, J B ^a   Lim, N S ^a   Lee, B H ^a   Renaud, L ^b   Park, C G ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b CAMECA   (United States)

Author keywords

Annealing; Atom probe field ion microscopy (AP FIM); Grain boundary segregation; Metals; Secondary ion mass spectroscopy (SIMS)

Indexed keywords

ALLOYING ELEMENTS; ANNEALING; ATOMS; AUSTENITE; BORON; BORON CARBIDE; CARBIDES; CARBON; GRAIN BOUNDARIES; HIGH STRENGTH ALLOYS; HIGH-STRENGTH LOW-ALLOY STEEL; IONS; METALS; PROBES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

ATOM PROBE FIELD-ION MICROSCOPIES; ATOM-PROBE TOMOGRAPHY; AUSTENITE GRAIN BOUNDARIES; BORON AND CARBONS; GRAIN BOUNDARY SEGREGATION; PRIOR AUSTENITE GRAIN BOUNDARIES; SECONDARY ION MASS SPECTROSCOPIES (SIMS); SECONDARY ION MASS SPECTROSCOPY;

SEGREGATION (METALLOGRAPHY);

EID: 80052685609     PISSN: 15989623     EISSN: 20054149     Source Type: Journal    
DOI: 10.1007/s12540-011-0617-y     Document Type: Article

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