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Volumn 44, Issue 7, 2009, Pages 1033-1049

The use of Auger spectroscopy for the in situ elemental characterization of sub-micrometer presolar grains

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Indexed keywords


EID: 70349731754     PISSN: 10869379     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1945-5100.2009.tb00786.x     Document Type: Article
Times cited : (34)

References (108)
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