Image blur and energy broadening effects in XPEEM

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1447-1454

  Locatelli, Andrea ^a   Menteş, Tevfik Onur ^a   Niño, Miguel Ángel ^a   Bauer, Ernst ^b  

^a SINCROTRONE TRIESTE   (Italy)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Boersch effect; Cathode lens; Image blur; LEEM; Loeffler effect; PEEM; Space charge; XPEEM

Indexed keywords

BOERSCH; CATHODE LENS; IMAGE BLUR; LEEM; LOEFFLER EFFECT; PEEM; SPACE CHARGES; XPEEM;

ELECTRON-ELECTRON INTERACTIONS;

ARTICLE; CONTROLLED STUDY; DIGITAL FILTERING; ELECTRON; ELECTRON MICROSCOPY; ILLUMINATION; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE QUALITY; LIGHT INTENSITY; LIGHT SCATTERING; MOLECULAR IMAGING; MOLECULAR INTERACTION; OPTICAL DENSITY; OPTICAL RESOLUTION; PHOTON; PROCESS MODEL; SPECTROSCOPY; X RAY PHOTOEMISSION ELECTRON MICROSCOPY;

EID: 80051811279     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.12.020     Document Type: Article

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