Nano- and microstructured polymer LB layers: A combined AFM/SIMS study

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 1006-1010

  Torrisi, V ^a   Tuccitto, N ^a   Delfanti, I ^a   Audinot, J N ^c   Zhavnerko, G ^b   Migeon, H N ^c   Licciardello, A ^a  

^a UNIVERSITY OF CATANIA   (Italy)

^b INSTITUTE OF CHEMISTRY OF NEW MATERIALS   (Belarus)

^c LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

Author keywords

AFM; NanoSIMS; Polymer blends; Surface patterning; ToF SIMS

Indexed keywords

AIR; ATOMIC FORCE MICROSCOPY; LANGMUIR BLODGETT FILMS; PHASE INTERFACES; POLYMER FILMS; SECONDARY ION MASS SPECTROMETRY;

AIR WATER INTERFACES; EXPERIMENTAL PARAMETERS; NANOSIMS; STRUCTURED POLYMER FILMS; SUB-MICRON SIZE RANGE; SURFACE ACTIVITIES; SURFACE PATTERNING; TOF SIMS;

POLYMER BLENDS;

EID: 56749163173     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.098     Document Type: Article

References (25)

1. Xia Y., Mrksich M., Kim E., and Whitesides G.M. J. Am. Chem. Soc. 117 (1995) 9576
2. Burn P.L., Kraft A., Baigent D.R., Bradley D.D.C., Brown A.R., Friend R.H., Gymer R.W., Holmes A.B., and Jackson R.W. J. Am. Chem. Soc. 115 (1993) 10117
3. Dai L., Griesser H.J., Hong X., Mau A.W.H., Spurling T.H., Yang Y., and White J.W. Macromolecules 29 (1996) 282
4. Nishizawa M., Shibuya M., Sawaguchi T., Matsue T., and Uchida I. J. Phys. Chem. 95 (1991) 9042
5. Burn P.L., Holmes A.B., Kraft A., Bradley D.D.C., Brawn A.R., Friend R.H., and Gymer R.W. Nature 356 (1992) 47
6. Healey B.G., Foran S.E., and Walt D.R. Science 269 (1995) 1078
7. Xia Y., Kim E., Zhao X.M., Rogers J.A., Prentiss M., and Whitesides G.M. Science 273 (1996) 347
8. Bohanon T., Elender G., Knoll W., Koberle P., Lee J.S., Offenhausser A., Ringsorf H., Sackmann E., Simon J., Tovar G., and Winnik F.M. J. Biomater. Sci. Polym. Ed. 8 (1996) 19
9. Bruening M.L., Zhou Y., Aguilar G., Agee R., Berbreiter D.E., and Crooks R.M. Langmuir 13 (1997) 770
10. Liu Y., Zhao M., Beigbreiter D.E., and Crooks R.M. J. Am. Chem. Soc. 119 (1997) 8720
11. Wells M., and Crooks R.M. J. Am. Chem. Soc. 118 (1996) 3988
12. Langer R., and Vacanti J.P. Science 260 (1993) 920
13. Chou S.Y., Krauss P.R., and Renstrom P.J. Science 272 (1996) 85
14. Chou S.Y., Krauss P.R., and Renstrom P.J. Appl. Phys. Lett. 67 (1995) 3114
15. Kim E., Xia Y., and Whitesides G.M. Nature 376 (1995) 581
16. Denekamp C., and Feringa B.L. Adv. Mater. 10 (1998) 1080
17. Luo C.X., Xing R.B., and Han Y.C. Surf. Sci. 552 (2004) 139
18. Widawski G., Rawiso B., and François B. Nature 283 (1994) 272
19. Mitov Z., and Kamacheva E. Phys. Rev. Lett. 81 (1998) 3427
20. Blodgett K.B., and Langmuir I. Phys. Rev. 51 (1937) 964
21. Zhavnerko G.K., Staroverov V.N., Agabekov V.E., Gallyamov M.O., and Yaminsky I.V. Thin Solid Films 359 (2000) 98-103
22. Benninghoven A. Angew. Chem. Int. Ed. Engl. 33 (1994) 1023-1043
23. Kailas L., Audinot J., Migeon H., and Bertrand P. Compos. Interfaces 13 4-6 (2006) 423-439
24. Kailas L., Audinot J., Migeon H., and Bertrand P. Appl. Surf. Sci. 231-232 (2004) 289-295
25. Gérard A.C., Poncin S., Caetano B., Sonveaux P., Audinot J.N., Feron O., Colin I.M., and Soncin F. Am. J. Pathol. 172 3 (2008) 748