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Volumn 238, Issue 3, 2010, Pages 189-199

NanoSIMS imaging of Bacillus spores sectioned by focused ion beam

Author keywords

FIB; Microbial forensics; NanoSIMS; Sample preparation

Indexed keywords

BACTERIOLOGY; ELECTRONS; FOCUSED ION BEAMS; FORENSIC SCIENCE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

EID: 77952625232     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03336.x     Document Type: Article
Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.