Advanced analytical techniques: Platform for nano materials science

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 60, Issue 1, 2005, Pages 13-26

  Adams, F ^a   Van Vaeck, L ^a   Barrett, R ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Auger emission spectrometry; Nanotechnology; Secondary ion mass spectrometry

Indexed keywords

AUGER EMISSION SPECTROMETRY; ELECTRON IMAGING; ION BEAM ANALYSIS (IBA); X RAY BEAMS;

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; LASER BEAM EFFECTS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SECONDARY ION MASS SPECTROMETRY; SYNCHROTRON RADIATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

MATERIALS SCIENCE;

EID: 11444256749     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.10.003     Document Type: Review

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