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Volumn 136, Issue 4, 2011, Pages 716-723

ToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: Effect of nanostructure on device efficiency

(16) Yu, Bang Ying a Kuo, Che Hung b Wang, Wei Ben c Yen, Guo Ji b Iida, Shin Ichi d Chen, Sun Zen c Lin, Wei Chun a Lee, Szu Hsian b Kao, Wei Lun b Liu, Chia Yi a Chang, Hsun Yun a You, Yun Wen a Chang, Chi Jen b Liu, Chi Ping a Jou, Jwo Huei c Shyue, Jing Jong a,b

a RESEARCH CENTER FOR APPLIED SCIENCES (Taiwan)

b NATIONAL TAIWAN UNIVERSITY (Taiwan)

c NATIONAL TSING HUA UNIVERSITY (Taiwan)

d ULVAC PHI Inc (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79551666311 PISSN: 00032654 EISSN: 13645528 Source Type: Journal
DOI: 10.1039/c0an00335b Document Type: Article

Times cited : (15)

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