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Volumn 151, Issue 1, 2010, Pages 39-55

Advances of SiC-based MOS capacitor hydrogen sensors for harsh environment applications

Author keywords

Dielectric layer; Harsh environment; Hydrogen sensor; Metal electrode; MOS capacitor; Silicon carbide (SiC)

Indexed keywords

CAPACITORS; DIELECTRIC DEVICES; ELECTRODES; HYDROGEN; SILICON CARBIDE;

EID: 78049482864     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2010.09.059     Document Type: Review
Times cited : (108)

References (156)
  • 3
    • 27844524921 scopus 로고    scopus 로고
    • Enhanced hydrogen selectivity of thermoelectric gas sensor by modification of platinum catalyst surface
    • N. Sawaguchi, W. Shin, N. Izu, I. Matsubara, and N. Murayama Enhanced hydrogen selectivity of thermoelectric gas sensor by modification of platinum catalyst surface Materials Letters 60 2006 313 316
    • (2006) Materials Letters , vol.60 , pp. 313-316
    • Sawaguchi, N.1    Shin, W.2    Izu, N.3    Matsubara, I.4    Murayama, N.5
  • 4
    • 28044434675 scopus 로고    scopus 로고
    • Fabrication of hydrogen sensors with transparent titanium oxide nanotube-array thin films as sensing elements
    • G.K. Mor, O.K. Varghese, M. Paulose, K.G. Ong, and C.A. Grimes Fabrication of hydrogen sensors with transparent titanium oxide nanotube-array thin films as sensing elements Thin Solid Films 496 2006 42 48
    • (2006) Thin Solid Films , vol.496 , pp. 42-48
    • Mor, G.K.1    Varghese, O.K.2    Paulose, M.3    Ong, K.G.4    Grimes, C.A.5
  • 11
    • 77549087028 scopus 로고    scopus 로고
    • Hydrogen induced cracking (HIC) testing of low alloy steel in sour environment: Impact of time of exposure on the extent of damage
    • J. Kittel, V. Smanio, M. Fregonese, L. Garnier, and X. Lefebvre Hydrogen induced cracking (HIC) testing of low alloy steel in sour environment: impact of time of exposure on the extent of damage Corrosion Science 52 2010 1386 1392
    • (2010) Corrosion Science , vol.52 , pp. 1386-1392
    • Kittel, J.1    Smanio, V.2    Fregonese, M.3    Garnier, L.4    Lefebvre, X.5
  • 13
    • 25144514029 scopus 로고    scopus 로고
    • Development of a highly sensitive porous Si-based hydrogen sensor using Pd nano-structures
    • K. Luongo, A. Sine, and S. Bhansali Development of a highly sensitive porous Si-based hydrogen sensor using Pd nano-structures Sensors and Actuators B 111-112 2005 125 129
    • (2005) Sensors and Actuators B , vol.111-112 , pp. 125-129
    • Luongo, K.1    Sine, A.2    Bhansali, S.3
  • 14
    • 38149059730 scopus 로고    scopus 로고
    • Advances in SiC field effect gas sensors
    • A.L. Spetz, and S. Savage Advances in SiC field effect gas sensors W.J. Choyke, H. Matsunami, G. Pensl, Silicon Carbide Recent Major Advances 2004 Springer Berlin 870 896
    • (2004) Silicon Carbide Recent Major Advances , pp. 870-896
    • Spetz, A.L.1    Savage, S.2
  • 16
    • 10044290845 scopus 로고    scopus 로고
    • Electrochemical hydrogen sensor for safety monitoring
    • L.P. Martin, A.-Q. Pham, and R.S. Glass Electrochemical hydrogen sensor for safety monitoring Solid State Ionics 175 2004 527 530
    • (2004) Solid State Ionics , vol.175 , pp. 527-530
    • Martin, L.P.1    Pham, A.-Q.2    Glass, R.S.3
  • 20
    • 0035304065 scopus 로고    scopus 로고
    • Review on materials, microsensors, systems, and devices for high-temperature and harsh-environment applications
    • M.R. Werner, and W.R. Fahrner Review on materials, microsensors, systems, and devices for high-temperature and harsh-environment applications IEEE Transactions on Industrial Electronics 48 2001 249 257
    • (2001) IEEE Transactions on Industrial Electronics , vol.48 , pp. 249-257
    • Werner, M.R.1    Fahrner, W.R.2
  • 24
    • 24144452804 scopus 로고    scopus 로고
    • AlGaN/GaN Schottky diode hydrogen sensor performance at high temperatures with different catalytic metals
    • J. Song, W. Lu, J.S. Flynn, and G.R. Brandes AlGaN/GaN Schottky diode hydrogen sensor performance at high temperatures with different catalytic metals Solid-State Electronics 49 2005 1130 1334
    • (2005) Solid-State Electronics , vol.49 , pp. 1130-1334
    • Song, J.1    Lu, W.2    Flynn, J.S.3    Brandes, G.R.4
  • 28
    • 0032680769 scopus 로고    scopus 로고
    • Silicon compatible materials for harsh environment sensors
    • G.H. Kroetz, M.H. Eickhoff, and H. Moeller Silicon compatible materials for harsh environment sensors Sensors and Actuators A 74 1999 182 189
    • (1999) Sensors and Actuators A , vol.74 , pp. 182-189
    • Kroetz, G.H.1    Eickhoff, M.H.2    Moeller, H.3
  • 29
    • 0033724158 scopus 로고    scopus 로고
    • A study on a platinum-silicon carbide Schottky diode as a hydrogen gas sensor
    • C.K. Kim, J.H. Lee, Y.H. Lee, N.I. Cho, and D.J. Kim A study on a platinum-silicon carbide Schottky diode as a hydrogen gas sensor Sensors and Actuators B 66 2000 116 118
    • (2000) Sensors and Actuators B , vol.66 , pp. 116-118
    • Kim, C.K.1    Lee, J.H.2    Lee, Y.H.3    Cho, N.I.4    Kim, D.J.5
  • 34
    • 0003597031 scopus 로고
    • INSPEC, the Institution of Electrical Engineers London, U.K.
    • G.L. Harris Properties of Silicon Carbide 1995 INSPEC, the Institution of Electrical Engineers London, U.K.
    • (1995) Properties of Silicon Carbide
    • Harris, G.L.1
  • 35
    • 0030562365 scopus 로고    scopus 로고
    • Kronig-Penney-like description for band gap variation in SiC polytypes
    • W.H. Backes, F.C. de Nooij, P.A. Bobbert, and W. van Haevingen Kronig-Penney-like description for band gap variation in SiC polytypes Physica B 217 1996 207 211
    • (1996) Physica B , vol.217 , pp. 207-211
    • Backes, W.H.1    De Nooij, F.C.2    Bobbert, P.A.3    Van Haevingen, W.4
  • 36
    • 0031192671 scopus 로고    scopus 로고
    • High temperature sensors based on metal-insulator-silicon carbide devices
    • A.L. Spetz, A. Baranzahi, P. Tobias, and I. Lundström High temperature sensors based on metal-insulator-silicon carbide devices Physica Status Solidi A 162 1997 493 551
    • (1997) Physica Status Solidi A , vol.162 , pp. 493-551
    • Spetz, A.L.1    Baranzahi, A.2    Tobias, P.3    Lundström, I.4
  • 37
    • 0030268828 scopus 로고    scopus 로고
    • Status of silicon carbide (SiC) as a wide-bandgap semiconductor for high temperature applications: A review
    • J.B. Casady, and R.W. Johnson Status of silicon carbide (SiC) as a wide-bandgap semiconductor for high temperature applications: a review Solid State Electronics 39 1996 1409 1422
    • (1996) Solid State Electronics , vol.39 , pp. 1409-1422
    • Casady, J.B.1    Johnson, R.W.2
  • 39
    • 0347309305 scopus 로고    scopus 로고
    • Recent developments in SiC device research
    • C.I. Harris, and A.O. Konstantinov Recent developments in SiC device research Physica Scripta T79 1999 27 31
    • (1999) Physica Scripta , vol.79 , pp. 27-31
    • Harris, C.I.1    Konstantinov, A.O.2
  • 40
    • 0035823684 scopus 로고    scopus 로고
    • Function and applications of gas sensors
    • D. Kohl Function and applications of gas sensors Journal of Physics D: Applied Physics 34 2001 125 149
    • (2001) Journal of Physics D: Applied Physics , vol.34 , pp. 125-149
    • Kohl, D.1
  • 41
    • 0038426995 scopus 로고    scopus 로고
    • High-temperature electronics - A role for wide bandgap semiconductors?
    • P.G. Neudeck, R.S. Okojie, and L-.Y. Chen High-temperature electronics - a role for wide bandgap semiconductors? Proceedings of the IEEE 6 2002 1065 1076
    • (2002) Proceedings of the IEEE , vol.6 , pp. 1065-1076
    • Neudeck, P.G.1    Okojie, R.S.2    Chen -., L.Y.3
  • 43
    • 78049470766 scopus 로고    scopus 로고
    • Silicon carbide (SiC)-based sensors for harsh environment applications
    • K.Y. Cheong Silicon carbide (SiC)-based sensors for harsh environment applications Jurutera 2007 22 29
    • (2007) Jurutera , pp. 22-29
    • Cheong, K.Y.1
  • 45
    • 45749137171 scopus 로고    scopus 로고
    • An overview of wide bandgap silicon carbide sensors and electronics development at NASA Glenn Research Center
    • Washington, United States
    • G.W. Hunter, P.G. Neudeck, G.M. Beheim, R.S. Okojie, L-.Y. Chen, D. Spry, and A. Trunek An overview of wide bandgap silicon carbide sensors and electronics development at NASA Glenn Research Center 212th ECS Meeting Washington, United States 2007 p11
    • (2007) 212th ECS Meeting , pp. 11
    • Hunter, G.W.1    Neudeck, P.G.2    Beheim, G.M.3    Okojie, R.S.4    Chen -., L.Y.5    Spry, D.6    Trunek, A.7
  • 46
    • 47649096068 scopus 로고    scopus 로고
    • High temperature field effect hydrogen and hydrocarbon gas sensors based on SiC MOS devices
    • A.S. Trinchi, W. Kandasamy, and Wlodarski High temperature field effect hydrogen and hydrocarbon gas sensors based on SiC MOS devices Sensors and Actuators B 133 2008 705 716
    • (2008) Sensors and Actuators B , vol.133 , pp. 705-716
    • Trinchi, A.S.1    Kandasamy, W.2    Wlodarski3
  • 47
    • 78049467272 scopus 로고    scopus 로고
    • FET gas-sensing mechanism, experimental and theoretical studies
    • A.L. Spetz, M. Skoglundh, and L. Ojamäe FET gas-sensing mechanism, experimental and theoretical studies E. Comini, G. Faglia, G. Sberveglieri, Solid State Gas Sensing 2009 Springer Science+Business Media, LLC 153 179
    • (2009) Solid State Gas Sensing , pp. 153-179
    • Spetz, A.L.1    Skoglundh, M.2    Ojamäe, L.3
  • 49
    • 0242664904 scopus 로고    scopus 로고
    • New tunnel Schottky SiC devices using mixed conduction ceramics
    • J. Cerda, J.R. Morante, and A.L. Spetz New tunnel Schottky SiC devices using mixed conduction ceramics Materials Science Forum 433 2003 949 952
    • (2003) Materials Science Forum , vol.433 , pp. 949-952
    • Cerda, J.1    Morante, J.R.2    Spetz, A.L.3
  • 51
    • 18744434482 scopus 로고    scopus 로고
    • NO gas detection at high temperature using thin-Pt 4H-SiC and 6H-SiC Schottky diodes
    • S.A. Khan, E.A. Vasconcelos, H. Uchida, and T. Katsube NO gas detection at high temperature using thin-Pt 4H-SiC and 6H-SiC Schottky diodes Materials Science Forum 433-436 2003 961 964
    • (2003) Materials Science Forum , vol.433-436 , pp. 961-964
    • Khan, S.A.1    Vasconcelos, E.A.2    Uchida, H.3    Katsube, T.4
  • 53
    • 78049476749 scopus 로고
    • Poison-resistant catalytic flammable-gas sensing elements
    • S.J. Gentry, and P.T. Walsh Poison-resistant catalytic flammable-gas sensing elements Sensors and Actuators B 1 1990 158 165
    • (1990) Sensors and Actuators B , vol.1 , pp. 158-165
    • Gentry, S.J.1    Walsh, P.T.2
  • 54
    • 0015636344 scopus 로고
    • The principles of the detection of flammable atmospheres by catalytic devices
    • J.G. Firth, A. Jones, and T.A. Jones The principles of the detection of flammable atmospheres by catalytic devices Combustion and Flame 21 1973 303 311
    • (1973) Combustion and Flame , vol.21 , pp. 303-311
    • Firth, J.G.1    Jones, A.2    Jones, T.A.3
  • 55
    • 0003053146 scopus 로고
    • Classification and terminology of sensors
    • S.M. Sze Classification and terminology of sensors S.M. Sze, Semiconductor Sensors 1994 Wiley-Interscience 1 16
    • (1994) Semiconductor Sensors , pp. 1-16
    • Sze, S.M.1
  • 57
    • 0141994057 scopus 로고    scopus 로고
    • Microfabrication and reliability study of sapphire based Ti/Pt-electrodes for thin-film gas sensor applications
    • W. Qu, W. Wlodarski, and M. Austin Microfabrication and reliability study of sapphire based Ti/Pt-electrodes for thin-film gas sensor applications Microelectronic Journal 31 2000 561 567
    • (2000) Microelectronic Journal , vol.31 , pp. 561-567
    • Qu, W.1    Wlodarski, W.2    Austin, M.3
  • 58
    • 51249162005 scopus 로고
    • Progress in silicon carbide semiconductor electronics technology
    • P.G. Neudeck Progress in silicon carbide semiconductor electronics technology Journal of Electronic Materials 24 1995 283 288
    • (1995) Journal of Electronic Materials , vol.24 , pp. 283-288
    • Neudeck, P.G.1
  • 64
    • 0027647550 scopus 로고
    • Gas sensors for high-temperature operation based on metal oxide silicon carbide (MOSiC) devices
    • A. Spetz, A. Arbab, and I. Lundström Gas sensors for high-temperature operation based on metal oxide silicon carbide (MOSiC) devices Sensors and Actuators B 15 1993 19 23
    • (1993) Sensors and Actuators B , vol.15 , pp. 19-23
    • Spetz, A.1    Arbab, A.2    Lundström, I.3
  • 68
    • 34250965271 scopus 로고
    • Halbleitertheorie der Sperrschicht
    • W. Schottky Halbleitertheorie der Sperrschicht Naturewissenschaften 26 1938 843
    • (1938) Naturewissenschaften , vol.26 , pp. 843
    • Schottky, W.1
  • 69
    • 84885149819 scopus 로고
    • Note on the contact between a metal and an insulator on semiconductor
    • N.F. Mott Note on the contact between a metal and an insulator on semiconductor Proceedings of the Cambridge Philosophical Society 34 1938 568 572
    • (1938) Proceedings of the Cambridge Philosophical Society , vol.34 , pp. 568-572
    • Mott, N.F.1
  • 70
    • 0002905465 scopus 로고
    • Theory of the boundary layer of crystal rectifiers
    • H.A. Bethe Theory of the boundary layer of crystal rectifiers MIT Radiation Laboratory Report 43 1942 12
    • (1942) MIT Radiation Laboratory Report , vol.43 , pp. 12
    • Bethe, H.A.1
  • 71
    • 0000766947 scopus 로고
    • Current transport in metal-semiconductor barriers
    • C.R. Crowell, and S.M. Sze Current transport in metal-semiconductor barriers Solid-State Electronics 9 1966 1035 1048
    • (1966) Solid-State Electronics , vol.9 , pp. 1035-1048
    • Crowell, C.R.1    Sze, S.M.2
  • 72
    • 36149025707 scopus 로고
    • Surface states and rectification at a metal semi-conductor contact
    • J. Bardeen Surface states and rectification at a metal semi-conductor contact Physical Review 71 1947 717 727
    • (1947) Physical Review , vol.71 , pp. 717-727
    • Bardeen, J.1
  • 73
    • 84944817348 scopus 로고
    • Silicon Schottky barrier diode with near-ideal I-V characteristics
    • M.P. Lepselter, and S.M. Sze Silicon Schottky barrier diode with near-ideal I-V characteristics Bell System Technical Journal 47 1968 195 208
    • (1968) Bell System Technical Journal , vol.47 , pp. 195-208
    • Lepselter, M.P.1    Sze, S.M.2
  • 75
    • 0001237346 scopus 로고
    • Schottky barrier formation at single crystal metal-semiconductor interfaces
    • R. Tung Schottky barrier formation at single crystal metal-semiconductor interfaces Physical Review Letters 152 1984 461 464
    • (1984) Physical Review Letters , vol.152 , pp. 461-464
    • Tung, R.1
  • 77
    • 11644266520 scopus 로고    scopus 로고
    • Studies of the ambient dependent inversion capacitance of catalytic metal-oxide-silicon carbide devices based on 6H- and 4H-SiC material
    • P. Tobias, A. Baranchi, I. Lundström, A. Schöner, K. Rottner, S. Karlsson, P. Mrtersson, and A.L. Spetz Studies of the ambient dependent inversion capacitance of catalytic metal-oxide-silicon carbide devices based on 6H- and 4H-SiC material Materials Science Forum 264-268 1998 1097 1100
    • (1998) Materials Science Forum , vol.264-268 , pp. 1097-1100
    • Tobias, P.1    Baranchi, A.2    Lundström, I.3    Schöner, A.4    Rottner, K.5    Karlsson, S.6    Mrtersson, P.7    Spetz, A.L.8
  • 78
    • 18844463006 scopus 로고    scopus 로고
    • Ozone treatment of SiC for improved performance of gas sensitive Schottky diodes
    • S. Zangooie, H. Arwin, I. Lundström, and A.L. Spetz Ozone treatment of SiC for improved performance of gas sensitive Schottky diodes Materials Science Forum 338-342 2000 1085 1088
    • (2000) Materials Science Forum , vol.338-342 , pp. 1085-1088
    • Zangooie, S.1    Arwin, H.2    Lundström, I.3    Spetz, A.L.4
  • 83
    • 0035851455 scopus 로고    scopus 로고
    • Pd/AlN/SiC thin-film devices for selective hydrogen sensing
    • DOI 10.1063/1.1415777
    • F. Serina, K.Y.S. Ng, C. Huang, G.W. Auner, L. Rimai, and R. Naik Pd/AlN/SiC thin-film devices for selective hydrogen sensing Applied Physics Letters 79 2001 3350 3352 (Pubitemid 33598746)
    • (2001) Applied Physics Letters , vol.79 , Issue.20 , pp. 3350-3352
    • Serina, F.1    Ng, K.Y.S.2    Huang, C.3    Auner, G.W.4    Rimai, L.5    Naik, R.6
  • 84
    • 78049478557 scopus 로고
    • US Patents No. 1,900,018
    • J.E. Lilienfeld, US Patents No. 1,900,018 (1928).
    • (1928)
    • Lilienfeld, J.E.1
  • 85
    • 84944485155 scopus 로고
    • The theory of p-n junctions in semiconductors and p-n junction transistors
    • W. Shockley The theory of p-n junctions in semiconductors and p-n junction transistors Bell System Technical Journal 28 1949 435 489
    • (1949) Bell System Technical Journal , vol.28 , pp. 435-489
    • Shockley, W.1
  • 86
    • 84927553170 scopus 로고
    • Carrier generation and recombination in p-n junctions and p-n junction characteristics
    • C.T. Sah, R.N. Noyce, and W. Shockley Carrier generation and recombination in p-n junctions and p-n junction characteristics Proceedings of the IRE 45 1957 1228 1243
    • (1957) Proceedings of the IRE , vol.45 , pp. 1228-1243
    • Sah, C.T.1    Noyce, R.N.2    Shockley, W.3
  • 87
    • 84938020814 scopus 로고
    • The evolution of the theory for the voltage-current characteristic of p-n junctions
    • J.L. Moll The evolution of the theory for the voltage-current characteristic of p-n junctions Proceedings of the IRE 46 1958 1076 1082
    • (1958) Proceedings of the IRE , vol.46 , pp. 1076-1082
    • Moll, J.L.1
  • 89
    • 78049461383 scopus 로고    scopus 로고
    • US Patents No. 0193,073
    • H.L. Tuller, R. Mlcak, US Patents No. 0193,073 (2003).
    • (2003)
    • Tuller, H.L.1    Mlcak, R.2
  • 91
    • 78049483601 scopus 로고
    • US Patents No. 1,745,175
    • J.E. Lilienfeld, US Patents No. 1,745,175 (1926).
    • (1926)
    • Lilienfeld, J.E.1
  • 92
    • 78049485476 scopus 로고
    • US Patents No. 1,877,140
    • J.E. Lilienfeld, US Patents No. 1,877,140 (1928).
    • (1928)
    • Lilienfeld, J.E.1
  • 93
    • 78049480867 scopus 로고
    • British Patents No. 439,457
    • O. Heil, British Patents No. 439,457 (1935).
    • (1935)
    • Heil, O.1
  • 94
    • 0242489213 scopus 로고    scopus 로고
    • The response of palladium metal-insulator-semiconductor devices to hydrogen-oxygen mixtures: Comparisons between kinetic models and experiment
    • J.W. Medlin, A.E. Lutz, R. Bastasz, and A.H. McDaniel The response of palladium metal-insulator-semiconductor devices to hydrogen-oxygen mixtures: comparisons between kinetic models and experiment Sensors and Actuators B 96 2003 290 297
    • (2003) Sensors and Actuators B , vol.96 , pp. 290-297
    • Medlin, J.W.1    Lutz, A.E.2    Bastasz, R.3    McDaniel, A.H.4
  • 95
    • 0008387467 scopus 로고
    • Variable capacitance with large capacitance charge, Part 3
    • J.L. Moll Variable capacitance with large capacitance charge, Part 3 Wescon Convention Record 1959 32
    • (1959) Wescon Convention Record , pp. 32
    • Moll, J.L.1
  • 96
    • 55849127041 scopus 로고
    • Semiconductor varactors using surface space-charge layers
    • W.G. Pfann, and C.G.B. Gavett Semiconductor varactors using surface space-charge layers Proceedings of the IRE 47 1959 2011 2012
    • (1959) Proceedings of the IRE , vol.47 , pp. 2011-2012
    • Pfann, W.G.1    Gavett, C.G.B.2
  • 98
    • 0001188528 scopus 로고
    • An investigation of surface states at a silicon-silicon oxide interface employing metal-oxide-silicon diodes
    • L.M. Terman An investigation of surface states at a silicon-silicon oxide interface employing metal-oxide-silicon diodes Solid-State Electronics 5 1962 285 299
    • (1962) Solid-State Electronics , vol.5 , pp. 285-299
    • Terman, L.M.1
  • 100
    • 84939383977 scopus 로고
    • 2 interface - Electrical properties as determined by the metal-insulator-silicon conductance technique
    • 2 interface - electrical properties as determined by the metal-insulator-silicon conductance technique Bell System Technical Journal 46 1967 1055
    • (1967) Bell System Technical Journal , vol.46 , pp. 1055
    • Nicollian, E.H.1    Goetzberger, A.2
  • 101
    • 0014805372 scopus 로고
    • A quazi-static technique for MOS C-V and surface state measurements
    • M. Kuhn A quazi-static technique for MOS C-V and surface state measurements Solid-State Electronics 13 1970 873
    • (1970) Solid-State Electronics , vol.13 , pp. 873
    • Kuhn, M.1
  • 103
    • 0000588944 scopus 로고
    • Surface protection and selective masking during diffusion in silicon
    • C.J. Frosch, and L. Derick Surface protection and selective masking during diffusion in silicon Journal of the Electrochemical Society 104 1957 547
    • (1957) Journal of the Electrochemical Society , vol.104 , pp. 547
    • Frosch, C.J.1    Derick, L.2
  • 104
    • 78049456887 scopus 로고    scopus 로고
    • MOS capacitor sensor array for hydrogen gas measurement
    • X.D. Qu MOS capacitor sensor array for hydrogen gas measurement Simon Fraser University 2005
    • (2005) Simon Fraser University
    • Qu, X.D.1
  • 105
    • 0000235794 scopus 로고
    • Reversible hydrogen annealing of metal oxide silicon carbide devices at high temperatures
    • A. Baranzahi, A.L. Spetz, and I. Lundström Reversible hydrogen annealing of metal oxide silicon carbide devices at high temperatures Applied Physics Letters 67 1995 3203
    • (1995) Applied Physics Letters , vol.67 , pp. 3203
    • Baranzahi, A.1    Spetz, A.L.2    Lundström, I.3
  • 106
    • 0038518410 scopus 로고    scopus 로고
    • Influence of interface states on high temperature SiC sensors and electronics
    • R.N. Ghosh, P. Tobias, and B. Golding Influence of interface states on high temperature SiC sensors and electronics Material Research Symposium 742 2003 363
    • (2003) Material Research Symposium , vol.742 , pp. 363
    • Ghosh, R.N.1    Tobias, P.2    Golding, B.3
  • 112
    • 49149135059 scopus 로고
    • Hydrogen sensitive MOS-structure. Part 1. Principles and applications
    • I. Lundström Hydrogen sensitive MOS-structure. Part 1. Principles and applications Sensors and Actuators 1 1981 403 426
    • (1981) Sensors and Actuators , vol.1 , pp. 403-426
    • Lundström, I.1
  • 115
    • 3042810377 scopus 로고    scopus 로고
    • Interface states in high-temperature gas sensors based on silicon carbide
    • P. Tobias, B. Golding, and R.N. Ghosh Interface states in high-temperature gas sensors based on silicon carbide IEEE Sensors Journal 2 2003 543 547
    • (2003) IEEE Sensors Journal , vol.2 , pp. 543-547
    • Tobias, P.1    Golding, B.2    Ghosh, R.N.3
  • 117
    • 0019698094 scopus 로고
    • Hydrogen sensitive MOS-structure. Part 2. Characterization
    • I. Lundström Hydrogen sensitive MOS-structure. Part 2. Characterization Sensors and Actuators 1 1981-1982 105 138
    • (1981) Sensors and Actuators , vol.1 , pp. 105-138
    • Lundström, I.1
  • 119
  • 121
    • 23044473295 scopus 로고    scopus 로고
    • Hydrogen interaction with platinum and palladium metal-insulator- semiconductor devices
    • A. Salomonsson, M. Eriksson, and H. Dannetun Hydrogen interaction with platinum and palladium metal-insulator-semiconductor devices Journal of Applied Physics 98 2005 014505-1-014505-9
    • (2005) Journal of Applied Physics , vol.98
    • Salomonsson, A.1    Eriksson, M.2    Dannetun, H.3
  • 123
    • 71849112060 scopus 로고    scopus 로고
    • Work function changes in gas sensitive materials: Fundamentals and applications
    • A. Oprea, N. Bârsan, and U. Weimar Work function changes in gas sensitive materials: fundamentals and applications Sensors and Actuators B 142 2009 470 493
    • (2009) Sensors and Actuators B , vol.142 , pp. 470-493
    • Oprea, A.1    Bârsan, N.2    Weimar, U.3
  • 125
    • 0001229883 scopus 로고
    • How can sensitive and selective semiconductor gas sensors be made?
    • J. Mizsei How can sensitive and selective semiconductor gas sensors be made? Sensors and Actuators B 23 1995 173 176
    • (1995) Sensors and Actuators B , vol.23 , pp. 173-176
    • Mizsei, J.1
  • 126
    • 0019713851 scopus 로고
    • 2 oxygen sensors in automotive applications
    • 2 oxygen sensors in automotive applications A.H. Heuer, L.W. Hobbs, Science and Technology of Zirconia 1981 American Ceramic Society, Inc. Columbus, Ohio 388 405
    • (1981) Science and Technology of Zirconia , pp. 388-405
    • Logotthetis, E.M.1
  • 127
    • 0019667962 scopus 로고
    • Zr fuel cells and electrolytes
    • H.S. Isaacs Zr fuel cells and electrolytes A.H. Heuer, L.W. Hobbs, Science and Technology of Zirconia 1981 American Ceramic Society, Inc. Columbus, Ohio 406 418
    • (1981) Science and Technology of Zirconia , pp. 406-418
    • Isaacs, H.S.1
  • 133
    • 0029288508 scopus 로고
    • Hydrogen-sensing mechanism of zinc oxide varistor gas sensors
    • F.C. Lin, Y. Takao, Y. Shimizu, and M. Egashira Hydrogen-sensing mechanism of zinc oxide varistor gas sensors Sensors and Actuators B 24-25 1995 843 850
    • (1995) Sensors and Actuators B , vol.2425 , pp. 843-850
    • Lin, F.C.1    Takao, Y.2    Shimizu, Y.3    Egashira, M.4
  • 134
    • 0004796483 scopus 로고    scopus 로고
    • Selective gas detection with high temperature operated metal oxides using catalytic filters
    • Sendai, Japan
    • M. Fleischer, and H. Meisner Selective gas detection with high temperature operated metal oxides using catalytic filters Proc. Transducers Sendai, Japan 1999 136 139
    • (1999) Proc. Transducers , pp. 136-139
    • Fleischer, M.1    Meisner, H.2
  • 137
    • 33845279781 scopus 로고
    • Catalytic etching of platinum foils and thin films in hydrogen-oxygen mixtures
    • V.W. Dean, M. Frenklach, and J. Phillips Catalytic etching of platinum foils and thin films in hydrogen-oxygen mixtures Journal of Physical Chemistry 92 1988 5731 5738
    • (1988) Journal of Physical Chemistry , vol.92 , pp. 5731-5738
    • Dean, V.W.1    Frenklach, M.2    Phillips, J.3
  • 140
  • 141
    • 0026208646 scopus 로고
    • New approaches for improving semiconductor gas sensors
    • N. Yamazoe New approaches for improving semiconductor gas sensors Sensors and Actuators B 5 1991 7 19
    • (1991) Sensors and Actuators B , vol.5 , pp. 7-19
    • Yamazoe, N.1
  • 142
    • 33646592845 scopus 로고    scopus 로고
    • Metal oxide nano-crystals for gas sensing
    • E. Comini Metal oxide nano-crystals for gas sensing Analytica Chimica Acta 568 2006 28 40
    • (2006) Analytica Chimica Acta , vol.568 , pp. 28-40
    • Comini, E.1
  • 152
    • 0037249878 scopus 로고    scopus 로고
    • Improved hydrogen-sensitive properties of MISiC Schottky sensor with thin NO-grown oxynitride as gate insulator
    • J.P. Xu, P.T. Lai, D.G. Zhong, and C.L. Chan Improved hydrogen-sensitive properties of MISiC Schottky sensor with thin NO-grown oxynitride as gate insulator IEEE Electron Device Letters 24 2003 13 15
    • (2003) IEEE Electron Device Letters , vol.24 , pp. 13-15
    • Xu, J.P.1    Lai, P.T.2    Zhong, D.G.3    Chan, C.L.4
  • 154
    • 18244399847 scopus 로고    scopus 로고
    • SiC field-effect devices operating at high temperature
    • R.N. Ghosh, and P. Tobias SiC field-effect devices operating at high temperature Journal of Electronic Materials 34 2005 345 350
    • (2005) Journal of Electronic Materials , vol.34 , pp. 345-350
    • Ghosh, R.N.1    Tobias, P.2


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