Sensing current and forces with SPM

Materials Today

Volumn 13, Issue 10, 2010, Pages 38-45

  Park, Jeong Y ^a,b   Maier, Sabine ^a   Hendriksen, Bas ^a   Salmeron, Miquel ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC-SCALE FORCES; CONDUCTION PROPERTIES; IMAGE SURFACE; MOLECULAR SCALE; NANO-SCALE MATERIALS; PROBE MATERIALS; SCANNING TUNNELING MICROSCOPY (STM); SENSING CURRENTS; SIMULTANEOUS DETECTION; WELL-ESTABLISHED TECHNIQUES;

ATOMIC FORCE MICROSCOPY; ATOMS; MATERIALS PROPERTIES;

SCANNING TUNNELING MICROSCOPY;

EID: 77958043131     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(10)70185-1     Document Type: Article

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