Electrical transport and mechanical properties of alkylsilane self-assembled monolayers on silicon surfaces probed by atomic force microscopy

Journal of Chemical Physics

Volumn 130, Issue 11, 2009, Pages

  Park, Jeong Young ^a   Qi, Yabing ^a   Ashby, Paul D ^a   Hendriksen, Bas L M ^a   Salmeron, Miquel ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b No 1760   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; FRICTION; MECHANICAL PROPERTIES; MOLECULES; ORGANIC POLYMERS; SILANES; TRIBOLOGY; VACUUM;

ALKYLSILANE; APPLIED PRESSURES; ATOMIC FORCE MICROSCOPY/FRICTION FORCE MICROSCOPIES; ATOMIC FORCES; CONDUCTANCE DECAYS; CONDUCTIVE PROBES; ELECTRICAL TRANSPORTS; FRICTIONAL RESPONSE; MOLECULAR CONDUCTIVITIES; MOLECULAR DEFORMATIONS; SILICON SURFACES; THIN OXIDE LAYERS; TUNNELING CURRENTS;

SELF ASSEMBLED MONOLAYERS;

EID: 63149171235     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3089789     Document Type: Article

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