A decade of piezoresponse force microscopy: Progress, challenges, and opportunities

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 53, Issue 12, 2006, Pages 2226-2251

  Kalinin, Sergei V ^a   Rar, Andrei ^a,b   Jesse, Stephen ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b SUPERPOWER INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMECHANICAL COUPLINGS; ELECTROMOTOR PROTEINS; PIEZORESPONSE FORCE MICROSCOPY; RELAXOR FERROELECTRICS;

CELL MEMBRANES; FERROELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; PROTEINS;

PEROVSKITE;

NANOMATERIAL;

ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELASTICITY; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELD; IMPEDANCE; INSTRUMENTATION; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; RADIATION EXPOSURE; REVIEW; ULTRASTRUCTURE;

COMPUTER SIMULATION; ELASTICITY; ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELDS; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; NANOSTRUCTURES; STRESS, MECHANICAL;

EID: 33846290317     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2006.169     Document Type: Article

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