Electrical Nanoprobing of Semiconducting Carbon Nanotubes Using an Atomic Force Microscope

Physical Review Letters

Volumn 92, Issue 4, 2004, Pages 464011-464014

  Yaish, Y ^a   Park, J Y ^a   Rosenblatt, S ^a   Sazonova, V ^a   Brink, M ^a   McEuen, P L ^a  

^a Sibley School of Mechanical and Aerospace Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTANCE; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; ELECTRON TRANSPORT PROPERTIES; ENERGY GAP; FERMI LEVEL; GOLD; MESFET DEVICES; SEMICONDUCTOR JUNCTIONS; THERMIONIC EMISSION; VOLTAGE MEASUREMENT;

BIAS VOLTAGE; SCHOTTKY BARRIERS; VALENCE BANDS; WORK FUNCTION;

CARBON NANOTUBES;

EID: 1442307087     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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