Mechanical and electrical properties of CdTe tetrapods studied by atomic force microscopy

Journal of Chemical Physics

Volumn 127, Issue 18, 2007, Pages

  Fang, Liang ^a   Park, Jeong Young ^a   Cui, Yi ^b   Alivisatos, Paul ^b   Shcrier, Joshua ^a   Lee, Byounghak ^a   Wang, Lin Wang ^a   Salmeron, Miquel ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; ELECTRON ENERGY LEVELS; ELECTROSTATICS; NANOCRYSTALS; SILICON WAFERS; STRAIN RATE;

IRREVERSIBLE DAMAGE; STRAIN DEFORMATION; TETRAPODS;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 36148929100     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2786993     Document Type: Article

References (19)

1. J. S. Liu, T. Tanaka, K. Sivula, A. P. Alivisatos, and J. M. J. Frechet, J. Am. Chem. Soc. 126, 6550 (2004).
2. D. J. Milliron, S. M. Hughes, Y. Cui, L. Manna, J. B. Li, L. W. Wang, and A. P. Alivisatos, Nature (London) 430, 190 (2004).
3. L. W. Wang, J. Phys. Chem. B 109, 23330 (2005).
4. J. B. Li and L. W. Wang, Appl. Phys. Lett. 85, 2929 (2004).
5. H. Yu, J. B. Li, R. A. Loomis, L. W. Wang, and W. E. Buhro, Nat. Mater. 2, 517 (2003).
6. E. A. Hassan, W. F. Heinz, M. D. Antonik, N. P. D'Costa, S. Nageswaran, C. A. Schoenenberger, and J. H. Hoh, Biophys. J. 74, 1564 (1998).
7. M. Radmacher, M. Fritz, J. P. Cleveland, D. A. Walters, and P. K. Hansma, Langmuir 10, 3809 (1994).
8. C. Rotsch and M. Radmacher, Langmuir 13, 2825 (1997).
9. J. Y. Park, R. J. Phaneuf, D. F. Ogletree, and M. Salmeron, Appl. Phys. Lett. 0003-6951 10.1063/1.1906297 86, 172105 (2005); J. Y. Park, D. F. Ogletree, M. Salmeron, C. J. Jenks, and P. A. Thiel, Tribol. Lett. 17, 629 (2004).
10. J. Y. Park, R. J. Phaneuf, D. F. Ogletree, and M. Salmeron, Appl. Phys. Lett. 0003-6951 10.1063/1.1906297 86, 172105 (2005); J. Y. Park, D. F. Ogletree, M. Salmeron, C. J. Jenks, and P. A. Thiel, Tribol. Lett. 17, 629 (2004).
11. J. E. Sader, J. W. M. Chon, and P. Mulvaney, Rev. Sci. Instrum. 70, 3967 (1999).
12. A. J. Williamson, L. W. Wang, and A. Zunger, Phys. Rev. B 62, 12963 (2000).
13. Semiconductors, II-VI and I-VII Compounds: Semimagnetic Compounds, edited by, U. Rossler, Landolt-Bornstein, New Series, Group III, Vol. 41B (Springer, Heidelberg, 1999).
14. S.-H. Wei and A. Zunger, Phys. Rev. B 60, 5404 (1999).
15. L. W. Wang and A. Zunger, J. Chem. Phys. 100, 2394 (1992).
16. J. Y. Park, D. F. Ogletree, P. A. Thiel, and M. Salmeron, Science 313, 186 (2006).
17. L. Manna, D. J. Milliron, A. Meisel, E. C. Scher, and A. P. Alivisatos, Nat. Mater. 2, 382 (2003).
18. J. Li and L. W. Wang, Nano Lett. 3, 1357 (2003).
19. L. W. Wang, J. Phys. Chem. B 109, 23330 (2005).