The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum

Journal of Applied Physics

Volumn 95, Issue 12, 2004, Pages 7694-7700

  Enachescu, M ^a   Carpick, R W ^b   Ogletree, D F ^a   Salmeron, M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBIDE-COATED PROBES; FORCE DISPLACEMENT; FRICTIONAL FORCES; LATTICE PERIODICITY;

ADHESION; ATOMIC FORCE MICROSCOPY; CARBIDES; COATED MATERIALS; CORRELATION METHODS; CRYSTAL IMPURITIES; ELECTRIC CONDUCTIVITY; FRICTION; LATTICE CONSTANTS; OHMIC CONTACTS; PASSIVATION; SCANNING TUNNELING MICROSCOPY; TRIBOLOGY; ULTRAHIGH VACUUM;

PLATINUM ALLOYS;

EID: 3142563283     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1738536     Document Type: Article

References (25)

1. I. L. Singer, in Fundamentals of Friction: Macroscopic and Microscopic Processes, edited by I. L. Singer and H. M. Pollock (Kluwer, Dordrecht, 1992), Vol. 220, p. 237.
2. I. L. Singer, MRS Bull. 23, 37 (1998).
3. C. F. Mcfadden and A. J. Gellman, Surf. Sci. 39, 287 (1997).
4. J. S. Ko and A. J. Gellman, Langmuir 16, 8343 (2000).
5. G. He, M. H. Muser, and M. O. Robbins, Science 284, 1650 (1999).
6. R. W. Carpick and M. Salmeron, Chem. Rev. 97, 1163 (1997).
7. N.-S. Park, M.-W. Kim, S. C. Langford, and J. T. Dickinson, Langmuir 12, 4599 (1996).
8. S. Kopta and M. Salmeron, J. Chem. Phys. 113, 8249 (2000).
9. E. Genecco, R. Bennefewitz, and E. Meyer, Phys. Rev. Lett. 88, 215501 (2002).
10. J. M. Helt and J. D. Batteas, Mica Surfaces: Charge Nucleation and Wear, in Encyclopedia of Nanoscience and Nanotechnology, edited by J. A. Schwarz, C. Contescu, and K. Putyera (Marcel Dekker, New York, 2004), Vol. 3, pp. 1947-1966.
11. L. M. Qian, X. D. Xiao, and S. Z. Wen, Langmuir 16, 662 (2000).
12. R. W. Carpick et al., Langmuir 12, 3334 (1996).
13. C. Drummond et al., Adv. Funct. Mater. 11, 348 (2001).
14. M. Enachescu, R. J. A. van den Oetelaar, R. W. Carpick, D. F. Ogletree, C. F. J. Flipse, and M. Salmeron, Phys. Rev. Lett. 81, 1877 (1998).
15. M. Enachescu, R. J. A. van den Oetelaar, R. W. Carpick, D. F. Ogletree, C. F. J. Flipse, and M. Salmeron, Tribol. Lett. 7, 73 (1999).
16. Q. Dai et al., Rev. Sci. Instrum. 66, 5266 (1995).
17. NT-MDT Inc., Moscow, Russia.
18. D. F. Ogletree, R. W. Carpick, and M. Salmeron, Rev. Sci. Instrum. 67, 3298 (1996).
19. K. L. Johnson, K. Kendall, and A. D. Roberts, Proc. R. Soc. London, Ser. A 324, 301 (1971).
20. B. V. Derjaguin, V. M. Muller, and Y. P. Toporov, J. Colloid Interface Sci. 53, 314 (1975).
21. R. W. Carpick, N. Agraït, D. F. Ogletree, and M. Salmeron, J. Vac. Sci. Technol. B 14, 1289 (1996).
22. J. N. Israelachvili, Intermolecular and Surface Forces, 2nd ed. (Academic, London, 1992).
23. R. Bennewitz et al., Tribol. Lett. 10, 51 (2001).
24. R. Bennewitz et al., Phys. Rev. B 60, R11301-4 (1999).
25. M. Enachescu et al., Phys. Rev. B 60, 16913-19 (1999).