Construction of pcAFM module to measure photoconductance with a nanoscale spatial resolution

Ultramicroscopy

Volumn 108, Issue 10, 2008, Pages 1090-1093

  Lee, Jeongjin ^a   Choi, Inhee ^a   Hong, Surin ^a   Lee, SuSeung ^a   Yang, Young In ^a   Kim, Younghun ^b   Yi, Jongheop ^a  

^a Seoul National University   (South Korea)

^b Kwangwoon University   (South Korea)

Author keywords

AFM module; Atomic force microscopy (AFM); Conducting probe AFM (CP AFM); Fullerene (C60); Photoconductive AFM (pcAFM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; BIAS CURRENTS; DIAMOND FILMS; ELECTRIC PROPERTIES; FULLERENES; LASERS; LAWS AND LEGISLATION; MICROSCOPIC EXAMINATION; MIRRORS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; SCANNING PROBE MICROSCOPY; TIN; TITANIUM COMPOUNDS;

AFM MODULE; ATOMIC FORCE MICROSCOPY (AFM); CONDUCTING PROBE AFM (CP-AFM); CONDUCTING PROBE-ATOMIC FORCE MICROSCOPY; ELECTRICAL PROPERTIES; ELECTRICAL SIGNALLING; FULLERENE; FULLERENE (C60); INDIUM TIN OXIDE SUBSTRATES; LASER IRRADIATIONS; LASER SOURCES; NANO SCALE RESOLUTION; NANO-DEVICES; NANOSCALE SPATIAL RESOLUTION; PHOTO-INDUCED CHANGES; PHOTOCONDUCTANCE; PHOTOCONDUCTIVE AFM (PCAFM); PROOF OF CONCEPTS; SAMPLE BIAS; STEERING MIRRORS;

IMAGING TECHNIQUES;

FULLERENE; INDIUM; TIN;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTANCE; ELECTRICITY; LASER; NANOANALYSIS; NANODEVICE;

EID: 49949110503     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.077     Document Type: Article

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