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Volumn 103, Issue 11, 2003, Pages 4367-4418

Scanning probe lithography using self-assembled monolayers

Author keywords

[No Author keywords available]

Indexed keywords

DIP-PEN NANOLITHOGRAPHY TECHNIQUE; LATERAL FORCE MICROSCOPY; MICROCONTACT PRINTING; NEAR FIELD SCANNING PROBE MICROSCOPY; SCANNING ELECTROCHEMICAL PROBE MICROSCOPY; SCANNING PROBE LITHOGRAPHY; SELF-ASSEMBLED MONOLAYERS;

EID: 3142771126     PISSN: 00092665     EISSN: None     Source Type: Journal    
DOI: 10.1021/cr020704m     Document Type: Article
Times cited : (419)

References (245)
  • 57
    • 0344645471 scopus 로고
    • Marrian, C. R. K., Ed.; SPIE-The International Society for Optical Engineering: Bellingham, WA
    • Majumdar, A.; Lindsay, S. M. In Technology of Proximal Probe Lithography; Marrian, C. R. K., Ed.; SPIE-The International Society for Optical Engineering: Bellingham, WA, 1993; Vol. IS 10, p 33.
    • (1993) Technology of Proximal Probe Lithography , vol.IS 10 , pp. 33
    • Majumdar, A.1    Lindsay, S.M.2
  • 58
    • 0344213911 scopus 로고
    • Marrian, C. R. K., Ed.; SPIE-The International Society for Optical Engineering: Bellingham, WA
    • Marrian, C. R. K.; Dobisz, E. A.; Dagata, J. A. In Technology of Proximal Probe Lithography; Marrian, C. R. K., Ed.; SPIE-The International Society for Optical Engineering: Bellingham, WA, 1993; Vol. IS 10, p 58.
    • (1993) Technology of Proximal Probe Lithography , vol.IS 10 , pp. 58
    • Marrian, C.R.K.1    Dobisz, E.A.2    Dagata, J.A.3
  • 60
    • 84891286275 scopus 로고
    • Marrian, C. R. K., Ed.; SPIE-The International Society for Optical Engineering: Bellingham, WA
    • Wiesendanger, R. In Technology of Proximal Probe Lithography; Marrian, C. R. K., Ed.; SPIE-The International Society for Optical Engineering: Bellingham, WA, 1993; Vol. IS 10, p 162.
    • (1993) Technology of Proximal Probe Lithography , vol.IS 10 , pp. 162
    • Wiesendanger, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.