Atomic force microscopy study of the mechanical and electrical properties of monolayer films of molecules with aromatic end groups

Langmuir

Volumn 23, Issue 23, 2007, Pages 11522-11525

  Fang, Liang ^a   Park, J Y ^a   Ma, H ^b   Jen, A K Y ^b   Salmeron, M ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC END GROUPS; MECHANICAL PERTURBATION; MONOLAYER FILMS;

AROMATIC COMPOUNDS; ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; FUNCTIONAL GROUPS; MOLECULAR STRUCTURE; THIN FILMS;

MONOLAYERS;

EID: 36248946829     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la701489p     Document Type: Article

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