Probing electrical transport properties at the nanoscale by Current-Sensing atomic force microscopy

NanoScience and Technology

Volumn 0, Issue , 2008, Pages 421-450

  Fumagalli, Laura ^a   Casuso, Ignacio ^a   Ferrari, Giorgio ^b   Gomila, Gabriel ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

Conductance; Conductive AFM; Current sensing atomic force microscopy; Current to voltage amplifier; Electrical transport; Impedance; Nanoscale capacitance microscopy; Nanoscale impedance microscopy; Noise

Indexed keywords

EID: 85016219567     PISSN: 14344904     EISSN: 21977127     Source Type: Book Series    
DOI: 10.1007/978-3-540-74080-3_12     Document Type: Article

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