Nano- and meso-measurement methods in the study of dielectrics

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 12, Issue 5, 2005, Pages 979-992

  Stevens, Gary C ^a,b,c   Baird, Patrick J ^a,b  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Institute of Physics   (United Kingdom)

^c IoP Dielectrics Group   (United Kingdom)

Author keywords

Dielectrics; Meso ; Micro measurements; Nano ; Polymer morphology; Scanning probe

Indexed keywords

MESO-; NANO-; PHOTOCHARGING; POLYMER MORPHOLOGY; SCANNING PROBE;

ELECTRIC CHARGE; FERROELECTRIC MATERIALS; MICROELECTRONICS; RAMAN SPECTROSCOPY;

DIELECTRIC MATERIALS;

EID: 28844508742     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2005.1522191     Document Type: Conference Paper

References (117)

1. B. Bhushan, B. Bhushan, H. Fuchs and S. Hosaka, Applied Scanning Probe Methods (Nanoscience and Technology), Springer-Verlag, 2004.
2. V. Tsukruk (Editor), Advances in Scanning Probe Microscopy (Macromolecular Symposia 167), John Wiley & Sons, 2001.
3. D. Bonnell (Editor), Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, John Wiley & Sons, 2000.
4. R. Wiesendanger, Scanning Probe Microscopy: Analytical Methods (Nanoscience and Technology), Springer-Verlag, 1998.
5. D. Sarid, Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces, 2nd ed., Oxford University Press: New York, 1994.
6. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy: Methods and Applications, Cambridge University Press: Cambridge, 1994.
7. N. A. Burnham and R. J. Colton, Force Microscopy, in Scanning Tunnelling Microscopy and Spectroscopy - Theory, Techniques and Applications, VCH Publishers, Inc: New York, 1993.
8. D. Sarid, V. Elings, "Review of scanning force microscopy", J.Vac.Sci.Technol., Vol. B9, pp. 431-7, 1991.
9. D. Rugar and P. Hansma, "Atomic force microscopy", Physics Today, Vol. 43, pp. 23-30, 1990.
10. H. K. Wickramasinghe, "Scanned-probe microscopes", Sci. Am., Vol. 261, pp. 74-81, 1989.
11. J. J. Janimak, L. Markey and G. C. Stevens, "Spherulitic banding in metallocene catalysed polyethylene spherulites," Polymer, Vol. 42, pp. 4675-4685, 2001.
12. L. Markey, J. J. Janimak and G. C. Stevens, "Modelling and simulation of the permanganic etching of banded spherulitic polyethylene: correlation with AFM observations", Polymer, Vol. 42, pp. 6221-6230, 2001.
13. Y. Martin, D. W. Abraham and H. K. Wickramasinghe, "High-resolution capacitance measurement and potentiometry by force microscopy," Appl. Phys. Lett., Vol. 52, pp. 1103-5, 1988.
14. J. E. Stern, B. D. Terris, H. J. Mamin and D. Rugar, "Deposition and imaging of localized charge on insulator surfaces using a force microscope", Appl. Phys. Lett., Vol. 53, pp. 2717-9, 1988.
15. B. D. Terris, J. E. Stern, D. Rugar and H. J. Mamin, "Contact electrification using force microscopy", Phys. Rev. Lett., Vol. 63, pp. 2669-72, 1989.
16. B. D. Terris, J. E. Stem, D. Rugar and H. J. Mamin, "Localized charge force microscopy", J. Vac. Sci. Technol., Vol. A8, pp. 374-7, 1990.
17. F. Saurenbach, B. D. Terris, "Electrostatic writing and imaging using a force microscope", IEEE Trans. Indust. Applies., Vol. 28, pp. 256-60, 1992.
18. F. Saurenbach, et al., "Force microscopy of ion-containing polymer surfaces - morphology and charge structure", Langmuir, Vol. 8, pp. 1199-1203, 1992.
19. S. Morita, Y. Fukano, T. Uchihashi, Y. Sugawara, Y. Yamanishi and T. Oasa, "Dissipation of contact-electrified charge on thin Si-oxide studied by atomic-force microscopy", Appl. Surf. Sci., Vol. 75, pp. 151-6, 1994.
20. S. Morita, Y. Fukano, T. Uchihashi, T. Okusako, Y. Sugawara, Y. Yamanishi and T. Oasa, "Reproducible and controllable contact electrification on a thin insulator", Jpn. J. Appl. Phys., Vol. 32, pp. L1701-3, 1993.
21. S. Morita, Y. Sugawara, Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Yamanishi and T. Oasa, "Stable-unstable phase-transition of densely contract-electrified electrons on thin silicon-oxide", Jpn. J. Appl. Phys., Vol. 32, pp. L1 852-4, 1993.
22. Y. Sugawara, Y. Fukano, T. Uchihashi, T. Okusako, S. Morita, Y. Yamanishi, T. Oasa and T. Okada, "Atomic-force microscopy studies of contact-electrified charges on silicon-oxide film", J. Vac. Sci. Technol., Vol. B12, pp. 1627-30, 1994.
23. Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Sugawara, Y. Yamanishi, T. Oasa and S. Morita, "Time evolution of contact-electrified electron dissipation on silicon-oxide surface investigated using noncontact atomic-force microscope", Jpn. J. Appl. Phys., Vol. 33, pp. 379-82, 1994.
24. Y. Fukano, K. J. Hontani, T. Uchihashi, T. Okusako, A. Chayahara, Y. Sugawara, Y. Yamanishi, T. Oasa and S. Morita, "Time-dependent dielectric-breakdown of thin silicon-oxide using dense contact electrification", Jpn. J. Appl. Phys., Vol. 33, pp. 3756-60, 1994.
25. Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Sugawara, Y. Yamanishi, T. Oasa and S. Morita, "Parameter dependence of stable state of densely contact-electrified electrons on thin silicon-oxide", Jpn. J. Appl. Phys., Vol. 33, pp. 6739-45, 1994.
26. Y. Sugawara, S. Morita, Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Yamanishi and T. Oasa, "Spatial-distribution and its phase-transition of densely contact-electrified electrons on a thin silicon-oxide", Jpn. J. Appl. Phys., Vol. 33, pp. L70-3, 1994.
27. Y. Sugawara, S. Morita, Y. Fukano, T. Uchihashi, T. Okusako, A. Chayahara, Y. Yamanishi and T. Oasa, "Spatial distributions of densely contact-electrified charges on a thin silicon-oxide", Jpn. J. Appl. Phys., Vol. 33, pp. L74-7, 1994.
28. T. Tsuyuguchi, T. Uchihashi, T. Okusako, Y. Sugawara, S. Morita, Y. Yamanishi and T. Oasa, "Contact electrification on thin silicon-oxide in vacuum", Jpn. J. Appl. Phys., Vol. 33, pp. L1046-8, 1994.
29. T. Uchihashi, T. Okusako, Y. Sugawara, Y. Yamanishi, T. Oasa and S. Morita, "Correlation between contact-electrified charge groups on a thin silicon oxide", J. Vac. Sci. Technol., Vol. B14, pp. 1055-9, 1996.
30. T. Uchihashi, T. Okusako, Y. Sugawara, Y. Yamanishi, T. Oasa and S. Morita, "Proximity effects of negative charge groups contact-electrified on thin silicon oxide in air", J. Appl. Phys., Vol. 79, pp. 4174-7, 1996.
31. Y. Fukano, Y. Sugawara, T. Uchihashi, T. Okusako, S. Morita, Y. Yamanishi and T. Oasa, "Phase transition of contact-electrified negative charges on a thin silicon oxide in air", Jpn. J. Appl. Phys., Vol. 35, pp. 2394-401, 1996.
32. S. Morita, T. Uchihashi, T. Okusako, Y. Yamanishi, T. Oasa and Y. Sugawara, "Stability of densely contact-electrified charges on thin silicon oxide in air", Jpn. J. Appl. Phys., Vol. 35, pp. 5811-4, 1996.
33. T. Uchihashi, A. Nakano, T. Ida, Y. Andoh, R. Kaneko, Y. Sugawara and S. Morita, "Charge dissipation on chemically treated thin silicon oxide in air", Jpn. J. Appl. Phys., Vol. 36, pp. 3755-8, 1997.
34. 3 film by contact electrification", Jpn. J. Appl. Phys., Vol. 33, pp. 5573-6, 1994.
35. 3 film by atomic-force microscope", Jpn. J. Appl. Phys., Vol. 33, pp. L374-6, 1994.
36. T. Okusako, T. Uchihashi, A. Nakano, T. Ida, Y. Sugawara and S. Morita, "Dissipation of contact electrified electrons on dielectric thin-films with silicon substrate", Jpn. J. Appl. Phys., Vol. 33, pp. L959-61, 1994.
37. K. Domansky, Y. Leng, C. C. Williams, J. Janata and D. Petelenz, "Mapping of mobile charges on insulator surfaces with the electrostatic force microscope", Appl. Phys. Lett., Vol. 63, pp. 1513-5, 1993.
38. Y. Leng and C. C. Williams, "Electrostatic characterization of biological and polymeric surfaces by electrostatic force microscopy", Colloids and Surfaces, Vol. A93, pp. 335-41, 1994.
39. N. Umeda, K. Makino, T. Takahashi, A. Takayanagi, "Charge deposition and imaging on a fluoride thin film using the scanning force microscope", J. Vac. Sci. Technol., Vol. B12, pp. 1600-3, 1994.
40. S. Cunningham and J. M. R. Weaver, "Contact charging dynamics and surface charge behaviour at sub-micron spatial resolution using scanning force microscopy", Electrostatics 1995, Inst. Phys. Conf. Ser., Vol. 143, pp. 109-12, 1995.
41. S. Cunningham and J. M. R. Weaver, "Studies of localised electrification and subsequent decay of surface potential in thin insulating films using scanning probe potentiometry", Electrostatics 1995. Inst. Phys. Conf. Ser., Vol. 143, pp. 215-8, 1995.
42. S. Cunningham, "On the role of field-induced polarization in the surface electrification of insulators", Appl. Phys. Lett., Vol. 69, pp. 3605-6, 1996.
43. S. Cunningham, "Dynamical studies of the single point contact electrification of inorganic and polymer substrates", J. Electrostal., Vol. 40 and 41, pp. 225-30, 1997.
44. P. J. S. Baird, J. R. Bowler and G. C. Stevens, "Quantitative methods for non-contact electrostatic force microscopy", Electrostatics 1999, Inst. Phys. Conf. Ser., Vol. 163, pp. 381-6, 1999.
45. D. M. Taylor, "Molecular nanostructures and their electrical probing", Thin Solid Films, Vol. 331, pp. 1-7, 1998.
46. B. Gady, R. Reifenberger and D. S. Rimai, "Contact electrification studies using atomic force microscope techniques", J. Appl. Phys., Vol. 84, pp.319-22, 1998.
47. H.-J. Butt, "Measuring electrostatic, vanderWaals, and hydration forces in electrolyte-solutions with an atomic force microscope", Biophys. J., Vol. 60, pp. 1438-44, 1991.
48. F. Bergasa and J. J. Saenz, "Is it possible to observe biological macromolecules by electrostatic force microscopy?", Ultramicroscopy, Vol. 42-44, pp. 1189-93, 1992.
49. H. Hieda, T. Ishino, K. Tanaka and N. Gemma, "Analysis on electrostatic tip sample interaction in aqueous-solution under potentiostatic condition", Jpn. J. Appl. Phys., Vol. 34, pp. 595-9, 1995.
50. S. Xu and M. F. Amsdorf, "Electrostatic force microscope for probing surface-charges in aqueous-solutions", Proc. Nat. Acad. Sci. USA, Vol. 92, pp. 10384-8, 1995.
51. C. Rotsch and M. Radmacher, "Mapping local electrostatic forces with the atomic force microscope", Langmuir, Vol. 13, pp. 2825-32, 1997.
52. 2 gate oxides using atomic force microscopy", Appl. Phys. Lett., Vol. 62, pp. 786-8, 1993.
53. M. E. Welland and M. P. Murrell, "Characterization of electronic and structural-properties of thin silicon dioxide films by scanned probe microscopy", Scanning, Vol. 15, pp. 251-6, 1993.
54. S. J. O'Shea, R. M. Atta, M. P. Murrell and M. E. Welland, "Conducting atomic-force microscopy study of silicon dioxide breakdown", J. Vac. Sci. Technol., Vol. B13, pp. 1945-52, 1995.
55. T. Yasue, Y. Yoshida, H. Koyama, T. Kato and T. Nishioka, "Dielectric breakdown of silicon oxide studied by scanning probe microscopy", J. Vac. Sci. Technol., Vol. B15, pp. 1884-8, 1997.
56. J. M. R. Weaver and D. W. Abraham, "High resolution atomic force microscopy potentiometry", J.Vac. Sci.Technol., Vol. B9, pp. 1559-61, 1991.
57. J. M. R. Weaver and H. K. Wickramasinghe, "Semiconductor characterization by scanning force microscope surface photovoltage microscopy", J. Vac. Sci. Technol., Vol. B9, pp. 1562-5, 1991.
58. M. Nonnenmacher, M. O'Boyle and H. K. Wickramasinghe, "Surface investigations with a Kelvin probe force microscope", Ultramicroscopy, Vol. 42, pp. 268-73, 1992.
59. G. E. Bridges, R. A. Said and D. J. Thomson, "Heterodyne electrostatic force microscopy for non-contact high frequency integrated circuit measurement", Electron. Lett., Vol. 29, pp. 1448-9, 1993.
60. G. E. Bridges, R. A. Said, M. Mittal and D. J. Thomson, "Sampled waveform measurement in integrated circuits using heterodyne electrostatic force microscopy", Rev. Sci. Instrum., Vol. 65, pp. 3378-81, 1994.
61. R. A. Said, G. E. Bridges and D. J. Thomson, "Scanned electrostatic force microscope for noninvasive high frequency potential measurement", Appl. Phys. Lett., Vol. 64, pp. 1442-4, 1994.
62. R. A. Said, G. E. Bridges and D. J. Thomson, "Noninvasive scanned probe potentiometry for integrated circuit diagnostics", IEEE Trans. Instrum. Meas., Vol. 43, pp. 469-74, 1994.
63. R. A. Said, M. Mittal, G. E. Bridges and D. J. Thomson, "High frequency potential probe using electrostatic force microscopy", J. Vac. Sci. Technol., Vol. B12, pp. 2591-4. 1994
64. G. E. Bridges, R. A. Said, M. Mittal and D. J. Thomson, "High-frequency pattern extraction in digital integrated circuits using scanning electrostatic force microscopy", J. Vac. Sci. Technol., Vol. B13, pp. 1375-9, 1995.
65. G. E. Bridges, D. Noruttun, R. A. Said, D. J. Thomson, T. Lam and R. Qi, "Non-contact probing of high speed microelectronics using electrostatic force sampling," J. Vac. Sci. Technol., Vol. A16, pp. 830-3, 1998.
66. A. S. Hou, F. Ho and D. M. Bloom, "Picosecond electrical sampling using a scanning force microscope", Electron. Lett., Vol. 28, pp. 2302-3, 1992.
67. F. Ho, A. S. Hou and D. M. Bloom, "High-speed integrated circuit probing using a scanning force microscope sampler", Electron. Lett., Vol. 30, pp. 560-2, 1994.
68. C. Bohm, F. Saurenbach, P. Taschner, C. Roths and E. Kubalek, "Voltage contrast in integrated circuits with 100 nm spatial resolution by scanning force microscopy", J. Phys. D, Vol. 26, pp. 1801-5, 1993.
69. C. Bohm, C. Roths and E. Kubalek, "Scanning-force-microscope test system for device internal test with high spatial and temporal resolution", Microelectronic Engineering, Vol. 24, pp. 91-8, 1994.
70. C. Bohm, C. Roths, U. Muller, A. Beyer and E. Kubalek, "Electrical characterization of integrated-circuits by scanning force microscopy", Materials Science and Engineering B, Vol. 24, pp. 218-22, 1994.
71. C. Bohm, J. Sprengepiel and E. Kubalek, "Scanning probe microscope gigahertz measurements on 200 nanometer wave guides", Scanning Microscopy, Vol. 9, pp. 965-8, 1995.
72. C. Bohm, J. Sprengepiel and E. Kubalek, "Voltage contrast studies on 0-center-dot-5 mu-m integrated-circuits by scanning force microscopy", Quality and Reliability Eng. J., Vol. 11, pp. 253-6, 1995.
73. A. Leyk, C. Bohm, D. W. van der Weide and E. Kubalek, "104GHz signals measured by high frequency scanning force microscope test system", Electron. Lett., Vol. 31, pp.1046-7, 1995.
74. A. Leyk and E. Kubalek, "MMIC internal electric-field mapping with submicrometer spatial-resolution and gigahertz bandwidth by means of high-frequency scanning force microscope testing", Electron. Lett., Vol. 31, pp. 2089-91, 1995.
75. C. Bohm, J. Sprengepiel and E. Kubalek, "Diagnosis in submicron integrated circuits by electric force microscopy", Microelectronics and Reliability, Vol. 36, pp. 1113-8, 1996.
76. C. Bohm, J. Sprengepiel, M. Otterbeck and E. Kubalek, "Voltage contrast in submicron integrated circuits by scanning force microscopy", Vac. Sci. Technol., Vol. B14, pp. 842-4, 1996.
77. A. Leyk and E. Kubalek, "Two-dimensional measurements of microwave voltage amplitude and phase distributions within a monolithic integrated interdigital capacitor with a high frequency scanning force microscope test system", Microelectronic Engineering, Vol. 31, pp. 187-94, 1996.
78. J. Sprengepiel, C Bohm and E Kubalek, "Digital signal measurements on passivated submicron ICs by scanning force microscope-testing", Microelectronic Engineering, Vol. 31, pp. 181-6, 1996.
79. A. Leyk, S. VanWaasen, F. J. Tegude and E Kubalek, "MMIC in-circuit and in-device testing with an on-wafer high frequency electric force microscope test system", Microelectronics and Reliability, Vol. 37, pp. 1575-8, 1997.
80. A. Leyk and E. Kubalek, "High spatially resolved MMIC-internal millimeter-wave measurements of sinusoidal signals by high frequency electric force microscope-testing", Electron. Lett., Vol. 34, pp. 196-8, 1998.
81. H. Hieda, K. Tanaka and N. Gemma, "Charge injection and extraction on organic dot structures by atomic force microscopy", J. Vac. Sci. Technol., Vol. B14, pp. 1234-7, 1996.
82. C. Schonenberger and S. F. Alvarado, "Observation of single charge-carriers by force microscopy", Phys. Rev. Lett., Vol. 65, pp. 3162-4, 1990.
83. C. Schonenberger, "Charge flow during metal-insulator contact", Phys. Rev. B, Vol. 45, pp. 3861-4, 1992.
84. 2 by scanning force microscopy", Appl. Phys. Lett., Vol. 74, pp. 472-4, 1999.
85. M. Nonnenmacher, M. P. O'Boyle and H. K. Wickramasinghe, "Kelvin probe force microscopy", Appl. Phys. Lett., Vol. 58, pp. 2921-3, 1991.
86. M. Yasutake, "Improvement of kelvin probe force microscope (KFM) system", Jpn. J. Appl. Phys., Vol. 34, pp. 3403-5, 1995.
87. R. M. Nyffenegger, R. M. Penner and R. Schierle, "Electrostatic force microscopy of silver nanocrystals with nanometer-scale resolution," Appl. Phys. Lett., Vol. 71, pp. 1878-80, 1997.
88. E. Soergel, W. Krieger and V. I. Vlad, "Charge distribution on photorefractive crystals observed with an atomic force microscope", Appl. Phys. A, Vol. 66, pp. S337-40, 1998.
89. T. D. Krauss and L. E. Brus, "Electronic properties of single semiconductor nanocrystals: optical and electrostatic force microscopy measurements", Materials Science and Engineering B, Vol. 69-70, pp. 289-294, 2000.
90. F. Saurenbach and B. D. Terris, "Imaging of ferroelectric domain walls by force microscopy", Appl. Phys. Lett., Vol. 56, pp. 1703-5, 1990.
91. R. Luthi, H. Haefke, K.-P. Meyer, E. Meyer, L. Howald and H.-J. Guntherodt, "Surface and domain structures of ferroelectric crystals studied with scanning force microscopy", J. Appl. Phys., Vol. 74, pp. 7461-71, 1993.
92. R. Luthi, H. Haefke, W. Gutmannsbauer, E. Meyer, L. Howald and H.-J. Guntherodt, "Statics and dynamics of ferroelectric domains studied with scanning force microscopy", J. Vac. Sci. Technol., Vol. B12, pp. 2451-5, 1994.
93. J. Ohgami, Y. Sugawara, S. Morita, E. Nakamura and T. Ozaki, "Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscape Combined with the Voltage Modulation Technique", Jpn. J. Appl. Phys., Vol. 35, pp. 2734-9, 1996.
94. H. Bluhm, A. Wadas, R. Wiesendanger, K.-P. Meyer and L. Szczesniak, "Electrostatic force microscopy on ferroelectric crystals in inert gas atmosphere", Phys. Rev. B, Vol. 55, pp. 4-7, 1997.
95. 3 by electrostatic force microscopy", Appl. Phys., Lett. 71, 146-8, 1997.
96. G. Zavala, J. H. Fendler and S. Trolier-McKinstry, "Characterization of ferroelectric lead zirconate titanate films by scanning force microscopy", J. Appl. Phys., Vol. 81, pp. 7480-91, 1997.
97. P. Guthner and K. Dransfeld, "Local poling of ferroelectric polymers by scanning force microscopy", Appl. Phys. Lett., Vol. 61, pp. 1137-9, 1992.
98. K. Franke, J. Besold, W. Häßler, and C. Seegebarth, 1994, "Modification and detection of domains on ferroelectric PZT films by scanning force microscopy", Surf. Sci. Lett., Vol. 302, pp. L283-8, 1994.
99. K. Franke and H. Hulz, "Investigation of poling behaviour of ferroelectric materials by electric force microscopy", Ferroelectrics Letters Section, Vol. 21, pp. 93-9, 1996.
100. K Franke, H. Huelz and M. Weihnacht, "Stress-induced depolarization in PZT thin films, measured by means of electric force microscopy", Surf. Sci., Vol. 416, pp. 59-67, 1998.
101. O. Kolosov, A. Gruverman, J. Hatano, K. Takahashi and H. Tokumoto., "Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy", Phys. Rev. Lett., Vol. 74, pp. 4309-12, 1995.
102. R. Lüthi and E. Meyer, Comment on "Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy", [Phys. Rev. Lett., Vol. 74, pp. 4309-12, 1995] Phys. Rev. Lett., Vol. 76, pp. 4291-2, 1996.
103. 3 thin film using scanning probe microscope", Appl. Phys. Lett., Vol. 68, pp. 2358-9, 1996.
104. K. Takata, Comment on "Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy", [J. Vac. Sci. Technol. Vol. B13, pp. 1095, 1995] J. Vac. Sci. Technol., Vol. B14, pp. 3393-4, 1996.
105. J. W. Hong and K. H. Noh, "Surface charge density and evolution of domain structure in triglycine sulfate determined by electrostatic-force microscopy", Phys. Rev. B, Vol. 58, pp. 5078-84, 1998.
106. J. W. Hong, D. S. Kahng, J. C. Shin, H. J. Kim and Z. G. Khim, "Detection and control of ferroelectric domains by an electrostatic force microscope", J. Vac. Sci. Technol., Vol. B16, pp. 2942-6, 1998.
107. H. Yokoyama, M. J. Jeffery and .T Inoue, "Heterodyne Force-Detection for High Frequency Local Dielectric Spectroscopy by Scanning Maxwell Stress Microscopy", Jpn. J. Appl. Phys., Vol. 32, pp. L1845-8, 1993.
108. H. Yokoyama and M. J. Jeffery, "Imaging high-frequency dielectric-dispersion of surfaces and thin-films by heterodyne force-detected scanning maxwell-stress microscopy", Colloids and Surfaces A, Vol. 93, pp.359-73, 1994.
109. L. E. Walther, N. E. Israeloff, E. V. Russell and H. A. Gomariz, "Mesoscopic-scale dielectric relaxation at the glass transition", Phys. Rev. B, Vol. 57, pp. R15112-115, 1998.
110. E. V. Russell, N. E. Israeloff, L. E. Walther and H. A. Gomariz, "Nanometer scale dielectric fluctuations at the glass transition", Phys. Rev. Lett., Vol. 81, pp. 1461-1464, 1998.
111. A. Hartschuh, N. Anderson and L. Novotny, "Near-field Raman spectroscopy using a sharp metal tip", J. Microsc, Vol. 210, pp. 234-240, 2003.
112. A. Hartschuh, E . Sanchez, X. S. Xie and L. Novotny, "High- resolution near-field Raman microscopy of single-walled carbon nanotubes", Phy. Rev. Lett., Vol. 90, art. no. 095503, 2003.
113. N. Hayazawa, Y. Inouye, Z. Sekkat and S. Kawata, "Near-field Raman scattering enhanced by a metallized tip", Chem. Phys. Lett., Vol. 335, pp. 369-374, 2001.
114. R. M. Stockle, Y. D. Suh, V. Deckert and R. Zenobi, "Nanoscale chemical analysis by tip-enhanced Raman spectroscopy", Chem. Phys. Lett., Vol. 318, pp. 131-136, 2000.
115. W. Machowski. P. Baird and W. Balachandran, "Study of Electrostatic Properties of Dielectric Surfaces and Powders Using Scanning Probe Microscopy", IEEE/IAS 1999 Annual Meeting, Oct 1999, Phoenix, Arizona, 1999.
116. J. W. Hong, Z. G. Khim, A. S. Hou and Sang-il Park, "Tapping mode atomic force microscopy using electrostatic force modulation", Appl. Phys. Lett., Vol. 69, pp.2831-3, 1996.
117. T. Glatzel, S. Sadewasser, R. Shikler, Y. Rosenwaks, M. C. Lux-Steiner, "Kelvin probe force microscopy on III-V semiconductors: the effect of surface defects on the local work function", Materials Science and Engineering B, Vol. 102, pp. 138-142, 2003.