Frequency domain lifetime characterization

IEEE Transactions on Electron Devices

Volumn 47, Issue 8, 2000, Pages 1653-1661

  Schroder, Dieter K ^a,b   Park, Jae Eun ^a,b   Tan, Suat Eng ^b   Choi, Byoung D ^b   Kishino, Seigo ^c   Yoshida, Haruhiko ^c  

^a IEEE   (United States)

^b Arizona State University   (United States)

^c UNIVERSITY OF HYOGO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICE MEASUREMENTS;

CAPACITANCE MEASUREMENT; ELECTRIC CONDUCTANCE; ELECTRIC RESISTANCE MEASUREMENT; ELECTRIC SPACE CHARGE; FREQUENCY DOMAIN ANALYSIS;

MOS CAPACITORS;

EID: 0034246625     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.853044     Document Type: Article

References (16)

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