Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy

Applied Physics Letters

Volumn 81, Issue 16, 2002, Pages 3043-3045

  Rawlett, Adam M ^a   Hopson, Theresa J ^a   Nagahara, Larry A ^a   Tsui, Raymond K ^a   Ramachandran, Ganesh K ^b   Lindsay, Stuart M ^b  

^a MOTOROLA INC   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM PROBE; AU NANOPARTICLE; CONDUCTING ATOMIC FORCE MICROSCOPY; DEFECT SITES; ELECTRICAL DATA; ELECTRICAL MEASUREMENT; ELECTRONIC MOLECULES; NEGATIVE DIFFERENTIAL RESISTANCES; TEST MOLECULES; TRANSPORT MEASUREMENTS;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; GOLD; MOLECULES; NANOPARTICLES; SELF ASSEMBLED MONOLAYERS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 79956015763     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1512815     Document Type: Article

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