Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

Applied Physics Letters

Volumn 86, Issue 12, 2005, Pages 1-3

  Houzé, Frédéric ^a   Chrétien, Pascal ^a   Schneegans, Olivier ^a   Meyer, René ^a   Boyer, Lionel ^a  

^a UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; IMAGING TECHNIQUES; MAGNETIC FIELD EFFECTS; OPTIMIZATION;

ELECTRICAL IMAGES; ELECTROSTATIC FORCE MICROSCOPY (EFM); SCANNING CAPACITANCE MICROSCOPY (SCM); TIP-SAMPLE POLARIZATION;

MAPPING;

EID: 17944362663     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1886262     Document Type: Article

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