WSXM: A software for scanning probe microscopy and a tool for nanotechnology

Review of Scientific Instruments

Volumn 78, Issue 1, 2007, Pages

  Horcas, I ^a   Fernandez R ^a   Gomez Rodriguez J M ^b   Colchero, J ^c   Gomez Herrero J ^b   Baro, A M ^d  

^a Centro Empresarial Euronova 3   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c UNIVERSITY OF MURCIA   (Spain)

^d INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

NANOTECHNOLOGY; SCANNING PROBE MICROSCOPY;

FREEWARE SCANNING PROBE MICROSCOPY;

WINDOWS OPERATING SYSTEM;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPUTER PROGRAM; IMAGE ENHANCEMENT; METHODOLOGY; NANOTECHNOLOGY;

IMAGE ENHANCEMENT; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; SOFTWARE;

EID: 34047109564     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2432410     Document Type: Article

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