Atomic force microscopy modified for studying electric properties of thin films and crystals. Review

Kristallografiya

Volumn 49, Issue 3, 2004, Pages 541-566

  Sorokina, K L ^a   Tolstikhina, A L ^a  

^a NONE

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EID: 2942694530     PISSN: 00234761     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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