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Volumn 83, Issue 10, 2003, Pages 2034-2036

Dielectric properties of organic monolayers directly bonded on silicon probed by current sensing atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; PHOTOCHEMICAL REACTIONS; SILICON;

EID: 0141920581     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1609237     Document Type: Article
Times cited : (53)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.