Atomic force microscopy of work functions on the nanometer scale

Applied Physics Letters

Volumn 74, Issue 18, 1999, Pages 2641-2642

  O'Boyle, M P ^a   Hwang, T T ^a,b   Wickramasinghe, H K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000348632     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123923     Document Type: Article

References (13)

1. D. Sarid, Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces (Oxford University Press, New York, 1991).
2. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy Methods and Application (Cambridge University Press, Cambridge, England, 1994).
3. E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, Science 251, 1468 (1991).
4. R. D. Grober, T. D. Harris, J. K. Trautman, E. Betzig, W. Wegscheider, L. Pferffer, and K. West, Appl. Phys. Lett. 64, 1421 (1994).
5. M. Volcker, W. Krieger, T. Suzuki, and H. Walther, J. Vac. Sci. Technol. B 9, 541 (1991).
6. C. C. Williams and H. K. Wickramasinghe, Nature (London) 344, 317 (1990).
7. M. Nonnemmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991).
8. M. Yasutake, D. Aoki, and M. Fujihira, Thin Solid Films 273, 279 (1996).
9. M. Yasutake, Jpn. J. Appl. Phys., Part 1 34, 3403 (1995).
10. A. Kikukawa, S. Hosaka, and R. Imura, Appl. Phys. Lett. 66, 3510 (1995).
11. M. Fujihira and H. Kawate, J. Vac. Sci. Technol. B 12, 1604 (1994).
12. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. 61, 4723 (1987).
13. O. Zuger and D. Rugar, J. Appl. Phys. 75, 6211 (1994).