Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

Review of Scientific Instruments

Volumn 69, Issue 4, 1998, Pages 1757-1764

  Lantz, M A ^a,b   O'Shea, S J ^a   Weiland, M E ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006316350     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148838     Document Type: Article

References (16)

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6. Nanosensors GmbH, Wacholderweg 8, D-71134 Aldlingen, Germany.
7. Spring constants are the values specified by the manufacturer. The largest error in the value of the spring constants calculated by the manufacturer is expected to arise from the variation in the cantilever thickness. For the cantilevers manufactured by Nanosensors (Ref. 6), the thickness was measured by the manufacturer to a tolerance of ±30 nm for each lever and the total tolerance specified by the manufacturer is approximately ±10%. For the diamond coated cantilevers, the cantilever thickness was not measured for each lever and the thickness of the diamond coating (approximately 2% of the total thickness) was not taken into account in the calculation of the spring constants. As such the tolerance in the quoted spring constants is expected to be much larger then ±10%.
8. A. Stalder and U. Dürig, Appl. Phys. Lett. 68, 637 (1996); A. Stalder and U. Dürig, J. Vac. Sci. Technol. B 14, 1259 (1996).
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13. A. R. Downes, Ph.D. thesis, University of Cambridge, 1997.
14. Supplied by P. Niedermann, CSEM, Neuchâtel, Switzerland, and N. Blanc, University of Neuchâtel.
15. O. Wolter (private communication).
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