Mechanism of electron conduction in self-assembled alkanethiol monolayer devices

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 3, 2003, Pages 354161-354167

  Wang, Wenyong ^a   Lee, Takhee ^a   Reed, M A ^a  

^a Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKANE; THIOL DERIVATIVE;

ARTICLE; DECAY COEFFICIENT; DEVICE; ELECTRON TRANSPORT; NANOPARTICLE; RADIOISOTOPE DECAY; TEMPERATURE DEPENDENCE;

EID: 0344110551     PISSN: 10980121     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (40)

1. R. M. Metzger, B. Chen, U. Holpfner, M. V. Lakshmikantham, D. Vuillaume, T. Kawai, X. Wu, H. Tachibana, T. V. Hughes, H. Sakurai, J. W. Baldwin, C. Hosch, M. P. Cava, L. Brehmer, and G. J. Ashwell, J. Am. Chem. Soc. 119, 10 455 (1997).
2. C. Zhou, M. R. Deshpande, M. A. Reed, L. Jones II, and J. M. Tour, Appl. Phys. Lett. 71, 611 (1997).
3. J. Chen, M. A. Reed, A. M. Rawlett, and J. M. Tour, Science 286, 1550 (1999); J. Chen, W. Wang, M. A. Reed, A. M. Rawlett, D. W. Price, and J. M. Tour, Appl. Phys. Lett. 77, 1224 (2000).
4. J. Chen, M. A. Reed, A. M. Rawlett, and J. M. Tour, Science 286, 1550 (1999); J. Chen, W. Wang, M. A. Reed, A. M. Rawlett, D. W. Price, and J. M. Tour, Appl. Phys. Lett. 77, 1224 (2000).
5. C. P. Collier, G. Mattersteig, E. W. Wong, Y. Luo, K. Beverly, J. Sampaio, F. M. Raymo, J. F. Stoddart, and J. R. Heath, Science 289, 1172 (2000).
6. M. A. Reed, J. Chen, A. M. Rawlett, D. W. Price, and J. M. Tour, Appl. Phys. Lett. 78, 3735 (2001).
7. A. Ulman, An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly (Academic, Boston, 1991).
8. L. A. Bumm, J. J. Arnold, T. D. Dunbar, D. L. Allara, and P. S. Weiss, J. Phys. Chem. B 103, 8122 (1999).
9. D. J. Wold, R. Haag, M. A. Rampi, and C. D. Frisbie, J. Phys. Chem. B 106, 2813 (2002).
10. X. D. Cui, X. Zarate, J. Tomfohr, O. F. Sankey, A. Primak, A. L. Moore, T A. Moore, D. Gust, G. Harris, and S. M. Lindsay, Nanotechnology 13, 5 (2002).
11. R. Holmlin, R. Haag, M. L. Chabinyc, R. F. Ismagilov, A. E. Cohen, A. Terfort, M. A. Rampi, and G. M. Whitesides, J. Am. Chem. Soc. 123, 5075 (2001); M. A. Rampi and G. M. Whitesides, Chem. Phys. 281, 373 (2002).
12. R. Holmlin, R. Haag, M. L. Chabinyc, R. F. Ismagilov, A. E. Cohen, A. Terfort, M. A. Rampi, and G. M. Whitesides, J. Am. Chem. Soc. 123, 5075 (2001); M. A. Rampi and G. M. Whitesides, Chem. Phys. 281, 373 (2002).
13. M. A. Ratner, B. Davis, M. Kemp, V. Mujica, A. Roitberg, and S. Yaliraki, in Molecular Electronics: Science and Technology, The Annals of the New York Academy of Sciences, Vol. 852, edited by A. Aviram and M. Ratner (The New York Academy of Sciences, New York, 1998).
14. K. S. Ralls, R. A. Buhrman, and R. C. Tiberio, Appl. Phys. Lett. 55, 2459 (1989).
15. S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981).
16. The models listed in Table I apply to solid-state insulators with one band.
17. J. Chen, L. C. Calvet, M. A. Reed, D. W. Carr, D. S. Grubisha, and D. W. Bennett, Chem. Phys. Lett. 313, 741 (1999).
18. L. Pizzagalli, C. Joachim, X. Bouju, and Ch. Girard, Europhys. Lett. 38, 97 (1997).
19. B. Mann and H. Kuhn, J. Appl. Phys. 42, 4398 (1971).
20. E. E. Polymeropoulos and J. Sagiv, J. Chem. Phys. 69, 1836 (1978).
21. F. F. Fan, J. Yang, L. Cai, D. W. Price, S. M. Dirk, D. V. Kosynkin, Y. Yao, A. M. Rawlett, J. M. Tour, and A. J. Bard, J. Am. Chem. Soc. 124, 5550 (2002).
22. K. Slowinski, H. K. Y. Fong, and M. Majda, J. Am. Chem. Soc. 121, 7257 (1999).
23. J. F. Smalley, S. W. Feldberg, C. E. D. Chidsey, M. R. Linford, M. D. Newton, and Y. Liu, J. Phys. Chem. 99, 13 141 (1995).
24. W. Franz, in Handbuch der Physik, edited by S. Flugge (Springer-Verlag, Berlin, 1956), Vol. 17, p. 155.
25. C. Joachim and M. Magoga, Chem. Phys. 281, 347 (2002).
26. G. Lewicki and C. A. Mead, Phys. Rev. Lett. 16, 939 (1966); R. Stratton, G. Lewicki, and C. A. Mead, J. Phys. Chem. Solids 27, 1599 (1966); G. H. Parker and C. A. Mead, Phys. Rev. Lett. 21, 605 (1968).
27. G. Lewicki and C. A. Mead, Phys. Rev. Lett. 16, 939 (1966); R. Stratton, G. Lewicki, and C. A. Mead, J. Phys. Chem. Solids 27, 1599 (1966); G. H. Parker and C. A. Mead, Phys. Rev. Lett. 21, 605 (1968).
28. G. Lewicki and C. A. Mead, Phys. Rev. Lett. 16, 939 (1966); R. Stratton, G. Lewicki, and C. A. Mead, J. Phys. Chem. Solids 27, 1599 (1966); G. H. Parker and C. A. Mead, Phys. Rev. Lett. 21, 605 (1968).
29. B. Brar, G. D. Wilk, and A. C. Seabaugh, Appl. Phys. Lett. 69, 2728 (1996).
30. J. G. Simmons, J. Appl. Phys. 34, 1793 (1963).
31. J. G. Simmons, J. Phys. D 4, 613 (1971); J. Maserjian and G. P. Petersson, Appl. Phys. Lett. 25, 50 (1974).
32. J. G. Simmons, J. Phys. D 4, 613 (1971); J. Maserjian and G. P. Petersson, Appl. Phys. Lett. 25, 50 (1974).
33. Nonlinear least-squares fittings were performed using MICROCAL ORIGIN 6.0.
34. Both bias values were used for the C8 data to compensate for an observed asymmetry and are plotted in Fig. 6.
35. M. P. Samanta, W. Tian, S. Datta, J. I. Henderson, and C. P. Kubiak, Phys. Rev. B 53, 7626 (1996).
36. X. D. Cui, A. Primak, X. Zarate, J. Tomfohr, O. F. Sankey, A. L. Moore, T. A. Moore, D. Gust, L. A. Nagahara, and S. M. Lindsay, J. Phys. Chem. B 106, 8609 (2002).
37. Although the HOMO-LUMO gap of alkyl-chain-type molecules has been reported (see Ref. 33), there is no experimental data on the HOMO-LUMO gap for the Au/alkanethiol SAM/Au system. 8 eV is commonly used as the HOMO-LUMO gap of alkanethiol.
38. C. Boulas, J. V. Davidovits, F. Rondelez, and D. Vuillaume, Phys. Rev. Lett. 76, 4797 (1996); M. Fujihira and H. Inokuchi, Chem. Phys. Lett. 17, 554 (1972); S. G. Lias, J. E. Bartmess, J. F. Liebman, J. L. Holmes, R. D. Levin, and W. G. Mallard, J. Phys. Chem. Ref. Data Suppl. 17, 24 (1988).
39. C. Boulas, J. V. Davidovits, F. Rondelez, and D. Vuillaume, Phys. Rev. Lett. 76, 4797 (1996); M. Fujihira and H. Inokuchi, Chem. Phys. Lett. 17, 554 (1972); S. G. Lias, J. E. Bartmess, J. F. Liebman, J. L. Holmes, R. D. Levin, and W. G. Mallard, J. Phys. Chem. Ref. Data Suppl. 17, 24 (1988).
40. C. Boulas, J. V. Davidovits, F. Rondelez, and D. Vuillaume, Phys. Rev. Lett. 76, 4797 (1996); M. Fujihira and H. Inokuchi, Chem. Phys. Lett. 17, 554 (1972); S. G. Lias, J. E. Bartmess, J. F. Liebman, J. L. Holmes, R. D. Levin, and W. G. Mallard, J. Phys. Chem. Ref. Data Suppl. 17, 24 (1988).